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NEXT Collaboration (Monrabal, F. et al); Laing, A.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Felkai, R.; Martinez, A.; Musti, M.; Querol, M.; Rodriguez, J.; Simon, A.; Torrent, J.; Botas, A.; Diaz, J.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Romo-Luque, C.; Sorel, M.; Yahlali, N. The NEXT White (NEW) detector 2018 Journal of Instrumentation 13 P12010 - 38pp details   doi
Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y. Mapping the depleted area of silicon diodes using a micro-focused X-ray beam 2019 Journal of Instrumentation 14 P03024 - 14pp details   doi
Poley, L.; Stolzenberg, U.; Schwenker, B.; Frey, A.; Gottlicher, P.; Marinas, C.; Stanitzki, M.; Stelzer, B. Mapping the material distribution of a complex structure in an electron beam 2021 Journal of Instrumentation 16 P01010 - 33pp details   doi
Renner, J.; Cervera-Villanueva, A.; Hernando, J.A.; Izmaylov, A.; Monrabal, F.; Muñoz, J.; Nygren, D.; Gomez-Cadenas, J.J. Improved background rejection in neutrinoless double beta decay experiments using a magnetic field in a high pressure xenon TPC 2015 Journal of Instrumentation 10 P12020 - 19pp details   doi
Schreeck, H.; Paschen, B.; Wieduwilt, P.; Ahlburg, P.; Andricek, L.; Dingfelder, J.; Frey, A.; Lutticke, F.; Marinas, C.; Richter, R.; Schwenker, B. Effects of gamma irradiation on DEPFET pixel sensors for the Belle II experiment 2020 Nuclear Instruments & Methods in Physics Research A 959 163522 - 9pp details   doi
Unno, Y. et al; Bernabeu, J.; Lacasta, C.; Solaz, C.; Soldevila, U. Specifications and pre-production of n plus -in-p large-format strip sensors fabricated in 6-inch silicon wafers, ATLAS18, for the Inner Tracker of the ATLAS Detector for High-Luminosity Large Hadron Collider 2023 Journal of Instrumentation 18 T03008 - 29pp details   doi
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