| Home | << 1 >> |
|
| Author | Title | Year | Publication | Volume | Pages |
|---|---|---|---|---|---|
| Mata, R.; Cros, A.; Gimeno, B.; Raboso, D. | Secondary electron emission yield in thick dielectric materials: a comparison between Kelvin probe and capacitive methods | 2024 | Journal of Physics D | 57 | 405302 - 9pp |