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Author  |
Title | Year | Publication | Volume | Pages |
|---|---|---|---|---|---|
| Salami, R. et al; Lacasta, C.; Lopez, H.; Platero, V.; Solaz, C.; Soldevila, U. | Quality concerns caused by quality control – deformation of silicon strip detector modules in thermal cycling tests | 2025 | Journal of Instrumentation | 20 | P03004 - 17pp |