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Ortiz Arciniega, J.L.; Carrio, F.; Valero, A. FPGA implementation of a deep learning algorithm for real-time signal reconstruction in particle detectors under high pile-up conditions 2019 Journal of Instrumentation 14 P09002 - 13pp details   doi
Pierre Auger Collaboration (Abreu, P. et al); Pastor, S. Techniques for measuring aerosol attenuation using the Central Laser Facility at the Pierre Auger Observatory 2013 Journal of Instrumentation 8 P04009 - 28pp details   doi
Pierre Auger Collaboration (Abreu, P. et al); Pastor, S. The rapid atmospheric monitoring system of the Pierre Auger Observatory 2012 Journal of Instrumentation 7 P09001 - 41pp details   doi
Pierre Auger Collaboration (Abreu, P. et al); Pastor, S. Antennas for the detection of radio emission pulses from cosmic-ray induced air showers at the Pierre Auger Observatory 2012 Journal of Instrumentation 7 P10011 - 49pp details   doi
Pierre Auger Collaboration (Abreu, P. et al); Pastor, S. The Pierre Auger Observatory scaler mode for the study of solar activity modulation of galactic cosmic rays 2011 Journal of Instrumentation 6 P01003 - 16pp details   doi
Poley, L. et al; Bernabeu, J.; Civera, J.V.; Lacasta, C.; Leon, P.; Platero, A.; Platero, V; Solaz, C.; Soldevila, U.; Vidal, G. The ABC130 barrel module prototyping programme for the ATLAS strip tracker 2020 Journal of Instrumentation 15 P09004 - 78pp details   doi
Poley, L. et al; Lacasta, C. Investigations into the impact of locally modified sensor architectures on the detection efficiency of silicon micro-strip sensors 2017 Journal of Instrumentation 12 P07006 - 17pp details   doi
Poley, L. et al; Lacasta, C.; Soldevila, U. Characterisation of strip silicon detectors for the ATLAS Phase-II Upgrade with a micro-focused X-ray beam 2016 Journal of Instrumentation 11 P07023 - 12pp details   doi
Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y. Mapping the depleted area of silicon diodes using a micro-focused X-ray beam 2019 Journal of Instrumentation 14 P03024 - 14pp details   doi
Poley, L.; Stolzenberg, U.; Schwenker, B.; Frey, A.; Gottlicher, P.; Marinas, C.; Stanitzki, M.; Stelzer, B. Mapping the material distribution of a complex structure in an electron beam 2021 Journal of Instrumentation 16 P01010 - 33pp details   doi
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