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Author Belver, D.; Cabanelas, P.; Castro, E.; Garzon, J.A.; Gil, A.; Gonzalez-Diaz, D.; Koenig, W.; Traxler, M. doi  openurl
  Title Performance of the Low-Jitter High-Gain/Bandwidth Front-End Electronics of the HADES tRPC Wall Type Journal Article
  Year 2010 Publication IEEE Transactions on Nuclear Science Abbreviated Journal IEEE Trans. Nucl. Sci.  
  Volume 57 Issue 5 Pages 2848-2856  
  Keywords Charge to width algorithm; fast amplifying and digitizing electronics; front-end electronics; HADES; time of flight; timing RPC  
  Abstract A front-end electronics (FEE) chain for accurate time measurements has been developed for the new Resistive Plate Chamber (RPC)-based Time-of-Flight (TOF) wall of the High Acceptance Di-Electron Spectrometer (HADES). The wall covers an area of around 8 m(2) divided in 6 sectors. In total, 1122 4-gap timing RPC cells are read-out by 2244 time and charge sensitive channels. The FEE chain consists of 2 custom-made boards: a 4-channel Daughter BOard(DBO) and a 32-channel MotherBOard (MBO). The DBO uses a fast 2 GHz amplifier feeding a dual high-speed discriminator. The time and charge information are encoded, respectively, in the leading edge and the width of an LVDS signal. Each MBO houses up to 8 DBOs providing them regulated voltage supply, threshold values via DACs, test signals and, additionally, routing out a signal proportional to the channel multiplicity needed for a 1st level trigger decision. The MBO delivers LVDS signals to a multi-purpose Trigger Readout Board (TRB) for data acquisition. The FEE allows achieving a system resolution around 75 ps fulfilling comfortably the requirements of the HADES upgrade [1]. The commissioning of the whole RPC wall is finished and the 6 sectors are already mounted in their final position in the HADES spectrometer and ready to take data during the beam-times foreseen for 2010.  
  Address [Belver, Daniel; Cabanelas, P.; Castro, E.; Garzon, J. A.] Univ Santiago Compostela, LabCAF, Santiago De Compostela 15782, Spain, Email: daniel.belver@usc.es  
  Corporate Author Thesis  
  Publisher Ieee-Inst Electrical Electronics Engineers Inc Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0018-9499 ISBN Medium (up)  
  Area Expedition Conference  
  Notes ISI:000283440400007 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ elepoucu @ Serial 349  
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