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Author |
Latonova, V. et al; Bernabeu, J.; Lacasta, C.; Solaz, C.; Soldevila, U. |
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Title |
Characterization of the polysilicon resistor in silicon strip sensors for ATLAS inner tracker as a function of temperature, pre- and post-irradiation |
Type |
Journal Article |
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Year |
2023 |
Publication |
Nuclear Instruments & Methods in Physics Research A |
Abbreviated Journal |
Nucl. Instrum. Methods Phys. Res. A |
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Volume  |
1050 |
Issue |
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Pages |
168119 - 5pp |
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Keywords |
HL-LHC; ATLAS ITk; Silicon micro-strip sensor; Polysilicon bias resistor; Testchip |
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Abstract |
The high luminosity upgrade of the Large Hadron Collider, foreseen for 2029, requires the replacement of the ATLAS Inner Detector with a new all-silicon Inner Tracker (ITk). The expected ultimate total integrated luminosity of 4000 fb(-1) means that the strip part of the ITk detector will be exposed to the total particle fluences and ionizing doses reaching the values of 1.6 center dot 10(15) MeVn(eq)/cm(2) and 0.66MGy, respectively, including a safety factor of 1.5. Radiation hard n(+)-in-p micro-strip sensors were developed by the ATLAS ITk strip collaboration and are produced by Hamamatsu Photonics K.K. The active area of each ITk strip sensor is delimited by the n-implant bias ring, which is connected to each individual n(+) implant strip by a polysilicon bias resistor. The total resistance of the polysilicon bias resistor should be within a specified range to keep all the strips at the same potential, prevent the signal discharge through the grounded bias ring and avoid the readout noise increase. While the polysilicon is a ubiquitous semiconductor material, the fluence and temperature dependence of its resistance is not easily predictable, especially for the tracking detector with the operational temperature significantly below the values typical for commercial microelectronics. Dependence of the resistance of polysilicon bias resistor on the temperature, as well as on the total delivered fluence and ionizing dose, was studied on the specially-designed test structures called ATLAS Testchips, both before and after their irradiation by protons, neutrons, and gammas to the maximal expected fluence and ionizing dose. The resistance has an atypical negative temperature dependence. It is different from silicon, which shows that the grain boundary has a significant contribution to the resistance. We discuss the contributions by parameterizing the activation energy of the polysilicon resistance as a function of the temperature for unirradiated and irradiated ATLAS Testchips. |
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Address |
[Latonova, V.; Federicova, P.; Kroll, J.; Kvasnicka, J.; Mikestikova, M.] Acad Sci Czech Republ, Inst Phys, Slovance 2, Prague 8, Czech Republic, Email: vera.latonova@cern.ch |
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Elsevier |
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English |
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ISSN |
0168-9002 |
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Notes |
WOS:001035405300001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
5601 |
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Author |
Helling, C. et al; Bernabeu, J.; Lacasta, C.; Solaz, C. |
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Title |
Strip sensor performance in prototype modules built for ATLAS ITk |
Type |
Journal Article |
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Year |
2020 |
Publication |
Nuclear Instruments & Methods in Physics Research A |
Abbreviated Journal |
Nucl. Instrum. Methods Phys. Res. A |
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Volume |
978 |
Issue |
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Pages |
164402 - 6pp |
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Keywords |
Silicon strip sensors; Strip module; Inter-strip isolation; Readout noise |
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Abstract |
ATLAS experiment is preparing an upgrade of its detector for High-Luminosity LHC (HL-LHC) operation. The upgrade involves installation of the new all-silicon Inner Tracker (ITk). In the context of the ITk preparations, more than 80 strip modules were built with prototype barrel sensors. They were tested with electrical readout on a per-channel basis. In general, an excellent performance was observed, consistent with previous ASIC-level and sensor-level tests. However, the lessons learned included two phenomena important for the future phases of the project. First was the need to store and test the modules in a dry environment due to humidity sensitivity of the sensors. The second was an observation of high noise regions for 2 modules. The high noise regions were tested further in several ways, including monitoring the performance as a function of time and bias voltage. Additionally, direct sensor-level tests were performed on the affected channels. The inter-strip resistance and bias resistance tests showed low values, indicating a temporary loss of the inter-strip isolation. A subsequent recovery of the noise performance was observed. We present the test details, an analysis of how the inter-strip isolation affects the module noise, and the relationship with sensor-level quality control tests. |
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Address |
[Helling, C.; Affolder, A. A.; Fadeyev, V.; Galloway, Z.; Gignac, M.; Gunnell, J.; Martinez-Mckinney, F.; Kang, N.; Yarwick, J.] Univ Calif Santa Cruz, Santa Cruz Inst Particle Phys, Santa Cruz, CA 95064 USA, Email: fadeyev@ucsc.edu |
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Elsevier |
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English |
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ISSN |
0168-9002 |
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Conference |
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Notes |
WOS:000560076700015 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
4505 |
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Author |
Bernabeu, J.; Di Domenico, A.; Villanueva-Perez, P. |
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Title |
Direct test of time reversal symmetry in the entangled neutral kaon system at a phi-factory |
Type |
Journal Article |
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Year |
2013 |
Publication |
Nuclear Physics B |
Abbreviated Journal |
Nucl. Phys. B |
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Volume |
868 |
Issue |
1 |
Pages |
102-119 |
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Keywords |
Time reversal violation; Discrete symmetries; Neutral kaons; phi-Factory |
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Abstract |
We present a novel method to perform a direct T (time reversal) symmetry test in the neutral kaon system, independent of any CP and/or CPT symmetry tests. This is based on the comparison of suitable transition probabilities, where the required interchange of in <-> out states for a given process is obtained exploiting the Einstein-Podolski-Rosen correlations of neutral kaon pairs produced at a phi-factory. In the time distribution between the two decays, we compare a reference transition like the one defined by the time-ordered decays (l(-), pi pi) with the T-conjugated one defined by (3 pi(0), l(+)). With the use of this and other T-conjugated comparisons, the KLOE-2 experiment at DA Phi NE could make a statistically significant test. |
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Address |
[Bernabeu, J.; Villanueva-Perez, P.] Univ Valencia, Dept Theoret Phys, Valencia, Spain, Email: jose.bernabeu@uv.es; |
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Publisher |
Elsevier Science Bv |
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English |
Summary Language |
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Original Title |
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Series Editor |
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Abbreviated Series Title |
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Series Volume |
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Edition |
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ISSN |
0550-3213 |
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Conference |
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Notes |
WOS:000314194800006 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
1320 |
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Author |
KLOE-2 Collaboration (Babusci, D. et al); Bernabeu, J. |
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Title |
Direct tests of T, CP, CPT symmetries in transitions of neutral K mesons with the KLOE experiment |
Type |
Journal Article |
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Year |
2023 |
Publication |
Physics Letters B |
Abbreviated Journal |
Phys. Lett. B |
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Volume |
845 |
Issue |
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Pages |
138164 - 11pp |
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Keywords |
Discrete and finite symmetries; Kaon physics; CP violation |
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Abstract |
Tests of the T, CP and CPT symmetries in the neutral kaon system are performed by the direct comparison of the probabilities of a kaon transition process to its symmetry-conjugate. The exchange of in and out states required for a genuine test involving an antiunitary transformation implied by time-reversal is implemented exploiting the entanglement of K0K0 pairs produced at a 0 -factory.A data sample collected by the KLOE experiment at DAONE corresponding to an integrated luminosity of about 1.7 fb-1 is analysed to study the At distributions of the 0 -> KSKL -> pi+pi- pi +/- e -/+ v and 0 -> KSKL -> pi +/- e -/+ v3 pi 0 processes, with At the difference of the kaon decay times. A comparison of the measured At distributions in the asymptotic region At ⠅ iS allows to test for the first time T and CPT symmetries in kaon transitions with a precision of few percent, and to observe CP violation with this novel method. |
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Address |
[Mandaglio, G.] INFN, Sez Catania, Catania, Italy, Email: eryk.czerwinski@uj.edu.pl |
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Elsevier |
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English |
Summary Language |
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Abbreviated Series Title |
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ISSN |
0370-2693 |
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Notes |
WOS:001080223500001 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ pastor @ |
Serial |
5704 |
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Author |
Aguilar-Saavedra, J.A.; Bernabeu, J. |
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Title |
W polarisation beyond helicity fractions in top quark decays |
Type |
Journal Article |
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Year |
2010 |
Publication |
Nuclear Physics B |
Abbreviated Journal |
Nucl. Phys. B |
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Volume |
840 |
Issue |
1-2 |
Pages |
349-378 |
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Keywords |
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Abstract |
We calculate the density matrix for the decay of a polarised top quark into a polarised W boson and a massive 17 quark, for the most general Wth vertex arising from dimension-six gauge-invariant effective operators. We show that, in addition to the well-known W helicity fractions, for polarised top decays it is worth defining and studying the transverse and normal W polarisation fractions, that is, the W polarisation alone two directions orthogonal to its momentum. In particular, a rather simple forward-backward asymmetry in the normal direction is found to be very sensitive to complex phases in one of the Wth anomalous couplings. This asymmetry, which indicates a normal W polarisation, can be generated for example by a P-odd. T-odd transition electric dipole moment. We also investigate the angular distribution of decay products in the top quark rest frame, calculating the spin analysing powers for a general Wth vertex. Finally we show that, using a combined fit to top decay observables and the t W cross section, at LHC it will be possible to obtain model-independent measurements of all the (complex) Wth couplings as well as the single top polarisation. Implications for spin correlations in top pair production are also discussed. |
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Address |
[Aguilar-Saavedra, J. A.] Univ Granada, Dept Fis Teor & Cosmos, E-18071 Granada, Spain, Email: jaas@ugr.es |
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Publisher |
Elsevier Science Bv |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0550-3213 |
ISBN |
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Conference |
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Notes |
ISI:000281832900013 |
Approved |
no |
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Is ISI |
yes |
International Collaboration |
yes |
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Call Number |
IFIC @ elepoucu @ |
Serial |
370 |
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