Abstract: The high luminosity upgrade of the Large Hadron Collider, foreseen for 2029, requires the replacement of the ATLAS Inner Detector with a new all-silicon Inner Tracker (ITk). The expected ultimate total integrated luminosity of 4000 fb(-1) means that the strip part of the ITk detector will be exposed to the total particle fluences and ionizing doses reaching the values of 1.6 center dot 10(15) MeVn(eq)/cm(2) and 0.66MGy, respectively, including a safety factor of 1.5. Radiation hard n(+)-in-p micro-strip sensors were developed by the ATLAS ITk strip collaboration and are produced by Hamamatsu Photonics K.K. The active area of each ITk strip sensor is delimited by the n-implant bias ring, which is connected to each individual n(+) implant strip by a polysilicon bias resistor. The total resistance of the polysilicon bias resistor should be within a specified range to keep all the strips at the same potential, prevent the signal discharge through the grounded bias ring and avoid the readout noise increase. While the polysilicon is a ubiquitous semiconductor material, the fluence and temperature dependence of its resistance is not easily predictable, especially for the tracking detector with the operational temperature significantly below the values typical for commercial microelectronics. Dependence of the resistance of polysilicon bias resistor on the temperature, as well as on the total delivered fluence and ionizing dose, was studied on the specially-designed test structures called ATLAS Testchips, both before and after their irradiation by protons, neutrons, and gammas to the maximal expected fluence and ionizing dose. The resistance has an atypical negative temperature dependence. It is different from silicon, which shows that the grain boundary has a significant contribution to the resistance. We discuss the contributions by parameterizing the activation energy of the polysilicon resistance as a function of the temperature for unirradiated and irradiated ATLAS Testchips.

Abstract: We present a novel method to perform a direct T (time reversal) symmetry test in the neutral kaon system, independent of any CP and/or CPT symmetry tests. This is based on the comparison of suitable transition probabilities, where the required interchange of in <-> out states for a given process is obtained exploiting the Einstein-Podolski-Rosen correlations of neutral kaon pairs produced at a phi-factory. In the time distribution between the two decays, we compare a reference transition like the one defined by the time-ordered decays (l(-), pi pi) with the T-conjugated one defined by (3 pi(0), l(+)). With the use of this and other T-conjugated comparisons, the KLOE-2 experiment at DA Phi NE could make a statistically significant test.

Abstract: We calculate the density matrix for the decay of a polarised top quark into a polarised W boson and a massive 17 quark, for the most general Wth vertex arising from dimension-six gauge-invariant effective operators. We show that, in addition to the well-known W helicity fractions, for polarised top decays it is worth defining and studying the transverse and normal W polarisation fractions, that is, the W polarisation alone two directions orthogonal to its momentum. In particular, a rather simple forward-backward asymmetry in the normal direction is found to be very sensitive to complex phases in one of the Wth anomalous couplings. This asymmetry, which indicates a normal W polarisation, can be generated for example by a P-odd. T-odd transition electric dipole moment. We also investigate the angular distribution of decay products in the top quark rest frame, calculating the spin analysing powers for a general Wth vertex. Finally we show that, using a combined fit to top decay observables and the t W cross section, at LHC it will be possible to obtain model-independent measurements of all the (complex) Wth couplings as well as the single top polarisation. Implications for spin correlations in top pair production are also discussed.