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Loya Villalpando, A. A., Martin-Albo, J., Chen, W. T., Guenette, R., Lego, C., Park, J. S., et al. (2020). Improving the light collection efficiency of silicon photomultipliers through the use of metalenses. J. Instrum., 15(11), P11021–13pp.
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NEXT Collaboration(Alvarez, V. et al), Carcel, S., Cervera-Villanueva, A., Diaz, J., Ferrario, P., Gil, A., et al. (2013). Initial results of NEXT-DEMO, a large-scale prototype of the NEXT-100 experiment. J. Instrum., 8, P04002–25pp.
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NEXT Collaboration(Renner, J. et al), Martinez-Lema, G., Alvarez, V., Benlloch-Rodriguez, J. M., Botas, A., Carcel, S., et al. (2018). Initial results on energy resolution of the NEXT-White detector. J. Instrum., 13, P10020–14pp.
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Andricek, L., Boronat, M., Fuster, J., Garcia, I., Gomis, P., Marinas, C., et al. (2016). Integrated cooling channels in position-sensitive silicon detectors. J. Instrum., 11, P06018–15pp.
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Gomez-Cadenas, J. J., Benlloch-Rodriguez, J. M., Ferrario, P., Monrabal, F., Rodriguez, J., & Toledo, J. F. (2016). Investigation of the coincidence resolving time performance of a PET scanner based on liquid xenon: a Monte Carlo study. J. Instrum., 11, P09011–18pp.
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Poley, L. et al, & Lacasta, C. (2017). Investigations into the impact of locally modified sensor architectures on the detection efficiency of silicon micro-strip sensors. J. Instrum., 12, P07006–17pp.
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NEXT Collaboration(Alvarez, V. et al), Carcel, S., Cervera-Villanueva, A., Diaz, J., Ferrario, P., Gil, A., et al. (2013). Ionization and scintillation response of high-pressure xenon gas to alpha particles. J. Instrum., 8, P05025–35pp.
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KM3NeT Collaboration(Aiello, S. et al), Alves Garre, S., Calvo, D., Carretero, V., Garcia Soto, A., Gozzini, S. R., et al. (2023). KM3NeT broadcast optical data transport system. J. Instrum., 18(2), T02001–22pp.
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Agaras, M. N. et al, & Fiorini, L. (2023). Laser calibration of the ATLAS Tile Calorimeter during LHC Run 2. J. Instrum., 18(6), P06023–35pp.
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Poley, L., Blue, A., Bloch, I., Buttar, C., Fadeyev, V., Fernandez-Tejero, J., et al. (2019). Mapping the depleted area of silicon diodes using a micro-focused X-ray beam. J. Instrum., 14, P03024–14pp.
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