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Author Latonova, V. et al; Bernabeu, J.; Lacasta, C.; Solaz, C.; Soldevila, U. doi  openurl
  Title (down) Characterization of the polysilicon resistor in silicon strip sensors for ATLAS inner tracker as a function of temperature, pre- and post-irradiation Type Journal Article
  Year 2023 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 1050 Issue Pages 168119 - 5pp  
  Keywords HL-LHC; ATLAS ITk; Silicon micro-strip sensor; Polysilicon bias resistor; Testchip  
  Abstract The high luminosity upgrade of the Large Hadron Collider, foreseen for 2029, requires the replacement of the ATLAS Inner Detector with a new all-silicon Inner Tracker (ITk). The expected ultimate total integrated luminosity of 4000 fb(-1) means that the strip part of the ITk detector will be exposed to the total particle fluences and ionizing doses reaching the values of 1.6 center dot 10(15) MeVn(eq)/cm(2) and 0.66MGy, respectively, including a safety factor of 1.5. Radiation hard n(+)-in-p micro-strip sensors were developed by the ATLAS ITk strip collaboration and are produced by Hamamatsu Photonics K.K. The active area of each ITk strip sensor is delimited by the n-implant bias ring, which is connected to each individual n(+) implant strip by a polysilicon bias resistor. The total resistance of the polysilicon bias resistor should be within a specified range to keep all the strips at the same potential, prevent the signal discharge through the grounded bias ring and avoid the readout noise increase. While the polysilicon is a ubiquitous semiconductor material, the fluence and temperature dependence of its resistance is not easily predictable, especially for the tracking detector with the operational temperature significantly below the values typical for commercial microelectronics. Dependence of the resistance of polysilicon bias resistor on the temperature, as well as on the total delivered fluence and ionizing dose, was studied on the specially-designed test structures called ATLAS Testchips, both before and after their irradiation by protons, neutrons, and gammas to the maximal expected fluence and ionizing dose. The resistance has an atypical negative temperature dependence. It is different from silicon, which shows that the grain boundary has a significant contribution to the resistance. We discuss the contributions by parameterizing the activation energy of the polysilicon resistance as a function of the temperature for unirradiated and irradiated ATLAS Testchips.  
  Address [Latonova, V.; Federicova, P.; Kroll, J.; Kvasnicka, J.; Mikestikova, M.] Acad Sci Czech Republ, Inst Phys, Slovance 2, Prague 8, Czech Republic, Email: vera.latonova@cern.ch  
  Corporate Author Thesis  
  Publisher Elsevier Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:001035405300001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5601  
Permanent link to this record
 

 
Author Miyagawa, P.S. et al; Bernabeu, P.; Lacasta, C.; Solaz, C.; Soldevila, U. doi  openurl
  Title (down) Analysis of the results from Quality Control tests performed on ATLAS18 Strip Sensors during on-going production Type Journal Article
  Year 2024 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 1064 Issue Pages 169457 - 9pp  
  Keywords HL-LHC; ATLAS; ITk; Strip sensors  
  Abstract The ATLAS experiment will replace its existing Inner Detector with the new all -silicon Inner Tracker (ITk) to cope with the operating conditions of the forthcoming high -luminosity phase of the LHC (HL-LHC). The outer regions of the ITk will be instrumented with similar to 18000 ATLAS18 strip sensors fabricated by Hamamatsu Photonics K.K. (HPK). With the launch of full-scale sensor production in 2021, the ITk strip sensor community has undertaken quality control (QC) testing of these sensors to ensure compliance with mechanical and electrical specifications agreed with HPK. The testing is conducted at seven QC sites on each of the monthly deliveries of similar to 500 sensors. This contribution will give an overview of the QC procedures and analysis; the tests most likely to determine pass/fail for a sensor are IV, long-term leakage current stability, full strip test and visual inspection. The contribution will then present trends in the results and properties following completion of similar to 60% of production testing. It will also mention challenges overcome through collaborative efforts with HPK during the early phases of production. With less than 5% of sensors rejected by QC testing, the overall production quality has been very good.  
  Address [Miyagawa, P. S.; Beck, G. A.; Bevan, A. J.; Chen, Z.; Dawson, I.; Zenz, S. C.] Queen Mary Univ London, Particle Phys Res Ctr, GO Jones Bldg, Mile End Rd, London E14NS, England, Email: paul.miyagawa@cern.ch  
  Corporate Author Thesis  
  Publisher Elsevier Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:001249611300001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 6158  
Permanent link to this record
 

 
Author Kim, J.S.; Reuter, J.; Rolbiecki, K.; Ruiz de Austri, R. url  doi
openurl 
  Title (down) A resonance without resonance: Scrutinizing the diphoton excess at 750 GeV Type Journal Article
  Year 2016 Publication Physics Letters B Abbreviated Journal Phys. Lett. B  
  Volume 755 Issue Pages 403-408  
  Keywords BSM phenomenology; LHC  
  Abstract Motivated by the recent diphoton excesses reported by both ATLAS and CMS collaborations, we suggest that a new heavy spinless particle is produced in gluon fusion at the LHC and decays to a couple of lighter pseudoscalars which then decay to photons. The new resonances could arise from a new strongly interacting sector and couple to Standard Model gauge bosons only via the corresponding Wess-Zumino-Witten anomaly. We present a detailed recast of the newest 13 TeV data from ATLAS and CMS together with the 8 TeV data to scan the consistency of the parameter space for those resonances.  
  Address [Kim, Jong Soo; Rolbiecki, Krzysztof] UAM CSIC, Inst Fis Teor, Madrid, Spain, Email: jong.kim@csic.es;  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0370-2693 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000373568100059 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 2713  
Permanent link to this record
 

 
Author Sanchis-Lozano, M.A.; Sarkisyan-Grinbaum, E. url  doi
openurl 
  Title (down) A correlated-cluster model and the ridge phenomenon in hadron-hadron collisions Type Journal Article
  Year 2017 Publication Physics Letters B Abbreviated Journal Phys. Lett. B  
  Volume 766 Issue Pages 170-176  
  Keywords pp interactions at LHC; Heavy-ion collisions at RHIC and LHC; Ridge phenomenon; Correlated clusters; Two-particle azimuthal and rapidity correlations  
  Abstract A study of the near-side ridge phenomenon in hadron-hadron collisions based on a cluster picture of multiparticle production is presented. The near-side ridge effect is shown to have a natural explanation in this context provided that clusters are produced in a correlated manner in the collision transverse plane.  
  Address [Sanchis-Lozano, Miguel-Angel] Ctr Mixto Univ Valencia, CSIC, Inst Fis Corpuscular IFIC, Dr Moliner 50, E-46100 Burjassot, Spain, Email: Miguel.Angel.Sanchis@ific.uv.es;  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0370-2693 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000396438300025 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3002  
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