Records |
Author |
Andricek, L. et al; Lacasta, C.; Marinas, C.; Vos, M. |
Title |
Intrinsic resolutions of DEPFET detector prototypes measured at beam tests |
Type |
Journal Article |
Year |
2011 |
Publication |
Nuclear Instruments & Methods in Physics Research A |
Abbreviated Journal |
Nucl. Instrum. Methods Phys. Res. A |
Volume |
638 |
Issue |
1 |
Pages |
24-32 |
Keywords |
Silicon pixel detector; Detector resolution; Spatial resolution; DEPFET; Beam test |
Abstract |
The paper is based on the data of the 2009 DEPFET beam test at CERN SPS. The beam test used beams of pions and electrons with energies between 40 and 120 GeV, and the sensors tested were prototypes with thickness of 450 μm and pixel pitch between 20 and 32 μm. Intrinsic resolutions of the detectors are calculated by disentangling the contributions of measurement errors and multiple scattering in tracking residuals. Properties of the intrinsic resolution estimates and factors that influence them are discussed. For the DEPFET detectors in the beam test, the calculation yields intrinsic resolutions of approximate to 1 μm, with a typical accuracy of 0.1 μm. Bias scan, angle scan, and energy scan are used as example studies to show that the intrinsic resolutions are a useful tool in studies of detector properties. With sufficiently precise telescopes, detailed resolution maps can be constructed and used to study and optimize detector performance. |
Address |
[Dolezal, Z.; Drasal, Z.; Kodys, P.; Kvasnicka, P.; Malina, L.; Scheirich, J.] Charles Univ Prague, Fac Math & Phys, Inst Particle & Nucl Phys, CR-18000 Prague, Czech Republic, Email: peter.kodys@mff.cuni.cz |
Corporate Author |
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Thesis |
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Publisher |
Elsevier Science Bv |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0168-9002 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
ISI:000290082600005 |
Approved |
no |
Is ISI |
yes |
International Collaboration |
yes |
Call Number |
IFIC @ pastor @ |
Serial |
618 |
Permanent link to this record |
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Author |
Poley, L.; Stolzenberg, U.; Schwenker, B.; Frey, A.; Gottlicher, P.; Marinas, C.; Stanitzki, M.; Stelzer, B. |
Title |
Mapping the material distribution of a complex structure in an electron beam |
Type |
Journal Article |
Year |
2021 |
Publication |
Journal of Instrumentation |
Abbreviated Journal |
J. Instrum. |
Volume |
16 |
Issue |
1 |
Pages |
P01010 - 33pp |
Keywords |
Detector modelling and simulations I (interaction of radiation with matter, interaction of photons with matter, interaction of hadrons with matter, etc); Particle tracking detectors; Detector design and construction technologies and materials |
Abstract |
The simulation and analysis of High Energy Physics experiments require a realistic simulation of the detector material and its distribution. The challenge is to describe all active and passive parts of large scale detectors like ATLAS in terms of their size, position and material composition. The common method for estimating the radiation length by weighing individual components, adding up their contributions and averaging the resulting material distribution over extended structures provides a good general estimate, but can deviate significantly from the material actually present. A method has been developed to assess its material distribution with high spatial resolution using the reconstructed scattering angles and hit positions of high energy electron tracks traversing an object under investigation. The study presented here shows measurements for an extended structure with a highly inhomogeneous material distribution. The structure under investigation is an End-of-Substructure-card prototype designed for the ATLAS Inner Tracker strip tracker – a PCB populated with components of a large range of material budgets and sizes. The measurements presented here summarise requirements for data samples and reconstructed electron tracks for reliable image reconstruction of large scale, inhomogeneous samples, choices of pixel sizes compared to the size of features under investigation as well as a bremsstrahlung correction for high material densities and thicknesses. |
Address |
[Poley, L.; Stelzer, B.] Simon Fraser Univ, Dept Phys, Univ Dr, Burnaby, BC, Canada, Email: APoley@cern.ch |
Corporate Author |
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Thesis |
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Publisher |
Iop Publishing Ltd |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1748-0221 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000608273000010 |
Approved |
no |
Is ISI |
yes |
International Collaboration |
yes |
Call Number |
IFIC @ pastor @ |
Serial |
4687 |
Permanent link to this record |
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Author |
Natochii, A. et al; Marinas, C. |
Title |
Measured and projected beam backgrounds in the Belle II experiment at the SuperKEKB collider |
Type |
Journal Article |
Year |
2023 |
Publication |
Nuclear Instruments & Methods in Physics Research A |
Abbreviated Journal |
Nucl. Instrum. Methods Phys. Res. A |
Volume |
1055 |
Issue |
|
Pages |
168550 - 21pp |
Keywords |
Detector background; Lepton collider; Monte-Carlo simulation |
Abstract |
The Belle II experiment at the SuperKEKB electron-positron collider aims to collect an unprecedented data set of 50 ab-1 to study CP-violation in the B-meson system and to search for Physics beyond the Standard Model. SuperKEKB is already the world's highest-luminosity collider. In order to collect the planned data set within approximately one decade, the target is to reach a peak luminosity of 6 x 1035 cm-2 s-1by further increasing the beam currents and reducing the beam size at the interaction point by squeezing the betatron function down to betay* = 0.3 mm. To ensure detector longevity and maintain good reconstruction performance, beam backgrounds must remain well controlled. We report on current background rates in Belle II and compare these against simulation. We find that a number of recent refinements have significantly improved the background simulation accuracy. Finally, we estimate the safety margins going forward. We predict that backgrounds should remain high but acceptable until a luminosity of at least 2.8 x 1035 cm-2 s-1is reached for betay* = 0.6 mm. At this point, the most vulnerable Belle II detectors, the Time-of-Propagation (TOP) particle identification system and the Central Drift Chamber (CDC), have predicted background hit rates from single-beam and luminosity backgrounds that add up to approximately half of the maximum acceptable rates. |
Address |
[Natochii, A.; Browder, T. E.; Schueler, J.; Vahsen, S. E.] Univ Hawaii, Honolulu, HI 96822 USA, Email: natochii@hawaii.edu; |
Corporate Author |
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Thesis |
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Publisher |
Elsevier |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0168-9002 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:001056103200001 |
Approved |
no |
Is ISI |
yes |
International Collaboration |
yes |
Call Number |
IFIC @ pastor @ |
Serial |
5626 |
Permanent link to this record |
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Author |
Belle II Collaboration (Abudinen, F. et al); Gomis, P.; Marinas, C. |
Title |
Measurement of the integrated luminosity of the Phase 2 data of the Belle II experiment |
Type |
Journal Article |
Year |
2020 |
Publication |
Chinese Physics C |
Abbreviated Journal |
Chin. Phys. C |
Volume |
44 |
Issue |
2 |
Pages |
021001 - 12pp |
Keywords |
luminosity; Bhabha; digamma; Belle II |
Abstract |
From April to July 2018, a data sample at the peak energy of the resonance was collected with the Belle II detector at the SuperKEKB electron-positron collider. This is the first data sample of the Belle II experiment. Using Bhabha and digamma events, we measure the integrated luminosity of the data sample to be (, where the first uncertainty is statistical and the second is systematic. This work provides a basis for future luminosity measurements at Belle II. |
Address |
[Jia, S.; Li, S. X.; Zhou, X. Y.] Beihang Univ, Beijing 100191, Peoples R China |
Corporate Author |
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Thesis |
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Publisher |
Iop Publishing Ltd |
Place of Publication |
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Editor |
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Language |
English |
Summary Language |
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Original Title |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1674-1137 |
ISBN |
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Medium |
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Area |
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Expedition |
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Conference |
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Notes |
WOS:000509919700001 |
Approved |
no |
Is ISI |
yes |
International Collaboration |
yes |
Call Number |
IFIC @ pastor @ |
Serial |
4270 |
Permanent link to this record |
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Author |
Liptak, Z. et al; Marinas, C. |
Title |
Measurements of beam backgrounds in SuperKEKB Phase 2 |
Type |
Journal Article |
Year |
2022 |
Publication |
Nuclear Instruments & Methods in Physics Research A |
Abbreviated Journal |
Nucl. Instrum. Methods Phys. Res. A |
Volume |
1040 |
Issue |
|
Pages |
167168 - 19pp |
Keywords |
|
Abstract |
The high design luminosity of the SuperKEKB electron–positron collider will result in challenging levels of beam-induced backgrounds in the interaction region. Understanding and mitigating these backgrounds is critical to the success of the Belle II experiment. We report on the first background measurements performed after roll-in of the Belle II detector, a period known as SuperKEKB Phase 2, utilizing both the BEAST II system of dedicated background detectors and the Belle II detector itself. We also report on first revisions to the background simulation made in response to our findings. Backgrounds measured include contributions from synchrotron radiation, beam-gas, Touschek, and injection backgrounds. At the end of Phase 2, single-beam backgrounds originating from the 4 GeV positron Low Energy Ring (LER) agree reasonably well with simulation, while backgrounds from the 7 GeV electron High Energy Ring (HER) are approximately one order of magnitude higher than simulation. We extrapolate these backgrounds forward and conclude it is safe to install the Belle II vertex detector. |
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Notes |
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Approved |
no |
Is ISI |
yes |
International Collaboration |
yes |
Call Number |
IFIC @ pastor @ |
Serial |
5496 |
Permanent link to this record |