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Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
NEXT Collaboration (Felkai, R. et al); Sorel, M.; Lopez-March, N.; Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Ferrario, P.; Laing, A.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Rodriguez, J.; Simon, A.; Torrent, J.; Yahlali, N. |
Helium-Xenon mixtures to improve the topological signature in high pressure gas xenon TPCs |
2018 |
Nuclear Instruments & Methods in Physics Research A |
905 |
82-90 |
|
|
Edgecock, T.R. et al; Agarwalla, S.K.; Cervera-Villanueva, A.; Donini, A.; Ghosh, T.; Gomez-Cadenas, J.J.; Hernandez, P.; Martin-Albo, J.; Mena, O. |
High intensity neutrino oscillation facilities in Europe |
2013 |
Physical Review Special Topics-Accelerators and Beams |
16 |
021002 - 18pp |
|
|
NEXT Collaboration (Rogers, L. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Martinez-Lema, G.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. |
High voltage insulation and gas absorption of polymers in high pressure argon and xenon gases |
2018 |
Journal of Instrumentation |
13 |
P10002 - 19pp |
|
|
Renner, J.; Cervera-Villanueva, A.; Hernando, J.A.; Izmaylov, A.; Monrabal, F.; Muñoz, J.; Nygren, D.; Gomez-Cadenas, J.J. |
Improved background rejection in neutrinoless double beta decay experiments using a magnetic field in a high pressure xenon TPC |
2015 |
Journal of Instrumentation |
10 |
P12020 - 19pp |
|
|
SciBooNE Collaboration (Kurimoto, Y. et al); Catala-Perez, J.; Gomez-Cadenas, J.J.; Sorel, M. |
Improved measurement of neutral current coherent pi(0) production on carbon in a few-GeV neutrino beam |
2010 |
Physical Review D |
81 |
111102 - 6pp |
|