| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Kuehn, S. et al; Bernabeu, J.; Lacasta, C.; Marco-Hernandez, R.; Rodriguez Rodriguez, D.; Santoyo, D.; Solaz, C.; Soldevila Serrano, U. |
Prototyping of petalets for the Phase-II upgrade of the silicon strip tracking detector of the ATLAS experiment |
2018 |
Journal of Instrumentation |
13 |
T03004 - 22pp |
| NEXT Collaboration (Simon, A. et al); Felkai, R.; Martinez-Lema, G.; Sorel, M.; Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Ferrario, P.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo Luque, C.; Torrent, J.; Yahlali, N. |
Electron drift properties in high pressure gaseous xenon |
2018 |
Journal of Instrumentation |
13 |
P07013 - 23pp |
| NEXT Collaboration (Martinez-Lema, G. et al); Palmeiro, B.; Botas, A.; Laing, A.; Renner, J.; Simon, A.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Perez, J.; Querol, M.; Rodriguez, J.; Romo-Lugue, C.; Sorel, M.; Torrent, J.; Yahlali, N. |
Calibration of the NEXT-White detector using Kr-83m decays |
2018 |
Journal of Instrumentation |
13 |
P10014 - 21pp |
| NEXT Collaboration (Monrabal, F. et al); Laing, A.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Felkai, R.; Martinez, A.; Musti, M.; Querol, M.; Rodriguez, J.; Simon, A.; Torrent, J.; Botas, A.; Diaz, J.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Romo-Luque, C.; Sorel, M.; Yahlali, N. |
The NEXT White (NEW) detector |
2018 |
Journal of Instrumentation |
13 |
P12010 - 38pp |
| Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y. |
Mapping the depleted area of silicon diodes using a micro-focused X-ray beam |
2019 |
Journal of Instrumentation |
14 |
P03024 - 14pp |
