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Cepedello, R.; Esser, F.; Hirsch, M.; Sanz, V. SMEFT goes dark: Dark Matter models for four-fermion operators 2023 Journal of High Energy Physics 09 081 - 47pp details   doi
Park, B.Y.; Paeng, W.G.; Vento, V. The inhomogeneous phase of dense skyrmion matter 2019 Nuclear Physics A 989 231-245 details   doi
Gimenez-Alventosa, V.; Gimenez, V.; Ballester, F.; Vijande, J.; Andreo, P. Correction factors for ionization chamber measurements with the 'Valencia' and 'large field Valencia' brachytherapy applicators 2018 Physics in Medicine and Biology 63 125004 - 10pp details   doi
Helling, C. et al; Bernabeu, J.; Lacasta, C.; Solaz, C. Strip sensor performance in prototype modules built for ATLAS ITk 2020 Nuclear Instruments & Methods in Physics Research A 978 164402 - 6pp details   doi
Andricek, L. et al; Lacasta, C.; Marinas, C.; Vos, M. Intrinsic resolutions of DEPFET detector prototypes measured at beam tests 2011 Nuclear Instruments & Methods in Physics Research A 638 24-32 details   doi
Real, D.; Calvo, D. Silicon Photomultipliers for Neutrino Telescopes 2023 Universe 9 326 - 14pp details   doi
Balibrea-Correa, J.; Lerendegui-Marco, J.; Calvo, D.; Caballero, L.; Babiano, V.; Ladarescu, I.; Redondo, M.L.; Tain, J.L.; Tolosa, A.; Domingo-Pardo, C.; Calvino, F.; Casanovas, A.; Tarifeño-Saldivia, A.; Alcayne, V.; Cano-Ott, D.; Martinez, T.; Guerrero, C.; Barbagallo, M.; Macina, D.; Bacak, M. A first prototype of C6D6 total-energy detector with SiPM readout for neutron capture time-of-flight experiments 2021 Nuclear Instruments & Methods in Physics Research A 985 164709 - 8pp details   doi
Affolder, A. et al; Garcia, C.; Lacasta, C.; Marco, R.; Marti-Garcia, S.; Miñano, M.; Soldevila, U. Silicon detectors for the sLHC 2011 Nuclear Instruments & Methods in Physics Research A 658 11-16 details   doi
Weber, M. et al; Esperante, D. DONES EVO: Risk mitigation for the IFMIF-DONES facility 2024 Nuclear Materials and Energy 38 101622 - 5pp details   doi
Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y. Mapping the depleted area of silicon diodes using a micro-focused X-ray beam 2019 Journal of Instrumentation 14 P03024 - 14pp details   doi
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