| Author |
Title |
Year |
Publication |
Volume |
Pages |
| NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. |
Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection |
2017 |
Physics Letters B |
773 |
663-671 |
| Gomez-Cadenas, J.J.; Martin-Albo, J.; Sorel, M.; Ferrario, P.; Monrabal, F.; Muñoz, J.; Novella, P.; Poves, A. |
Sense and sensitivity of double beta decay experiments |
2011 |
Journal of Cosmology and Astroparticle Physics |
06 |
007 - 30pp |
| DUNE Collaboration (Abud, A.A. et al); Amedo, P.; Antonova, M.; Barenboim, G.; Cervera-Villanueva, A.; De Romeri, V.; Garcia-Peris, M.A.; Martin-Albo, J.; Martinez-Mirave, P.; Mena, O.; Molina Bueno, L.; Novella, P.; Pompa, F.; Rocabado Rocha, J.L.; Sorel, M.; Tortola, M.; Tuzi, M.; Valle, J.W.F.; Yahlali, N. |
Highly-parallelized simulation of a pixelated LArTPC on a GPU |
2023 |
Journal of Instrumentation |
18 |
P04034 - 35pp |
| NEXT Collaboration (Alvarez, V. et al); Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gil, A.; Gomez-Cadenas, J.J.; Gonzalez, K.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Sorel, M.; Yahlali, N. |
NEXT-100 Technical Design Report (TDR). Executive summary |
2012 |
Journal of Instrumentation |
7 |
T06001 - 34pp |
| NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
2020 |
Journal of Instrumentation |
15 |
P11031 - 16pp |
