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Garcia, A.R.; Martinez, T.; Cano-Ott, D.; Castilla, J.; Guerrero, C.; Marin, J.; Martinez, G.; Mendoza, E.; Ovejero, M.C.; Reillo, E.M.; Santos, C.; Tera, F.J.; Villamarin, D.; Nolte, R.; Agramunt, J.; Algora, A.; Tain, J.L.; Banerjee, K.; Bhattacharya, C.; Pentilla, H.; Rinta-Antila, S.; Gorelov, D. MONSTER: a time of flight spectrometer for beta-delayed neutron emission measurements 2012 Journal of Instrumentation 7 C05012 - 12pp details   doi
Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y. Mapping the depleted area of silicon diodes using a micro-focused X-ray beam 2019 Journal of Instrumentation 14 P03024 - 14pp details   doi
Poley, L. et al; Lacasta, C. Investigations into the impact of locally modified sensor architectures on the detection efficiency of silicon micro-strip sensors 2017 Journal of Instrumentation 12 P07006 - 17pp details   doi
Kuehn, S. et al; Bernabeu, J.; Lacasta, C.; Marco-Hernandez, R.; Santoyo, D.; Solaz, C.; Soldevila, U. Prototyping of hybrids and modules for the forward silicon strip tracking detector for the ATLAS Phase-II upgrade 2017 Journal of Instrumentation 12 P05015 - 26pp details   doi
ATLAS Collaboration (Aad, G. et al); Bernabeu Verdu, J.; Cabrera Urban, S.; Castillo Gimenez, V.; Costa, M.J.; Fassi, F.; Ferrer, A.; Fiorini, L.; Fuster, J.; Garcia, C.; Garcia-Argos, C.; Garcia Navarro, J.E.; Gonzalez de la Hoz, S.; Hernandez Jimenez, Y.; Higon-Rodriguez, E.; Irles Quiles, A.; Kaci, M.; King, M.; Lacasta, C.; Lacuesta, V.R.; March, L.; Marti-Garcia, S.; Miñano, M.; Mitsou, V.A.; Moles-Valls, R.; Oliver Garcia, E.; Pedraza Lopez, S.; Perez Garcia-Estañ, M.T.; Romero Adam, E.; Ros, E.; Salt, J.; Sanchez Martinez, V.; Soldevila, U.; Sanchez, J.; Torro Pastor, E.; Valero, A.; Valladolid Gallego, E.; Valls Ferrer, J.A.; Villaplana Perez, M.; Vos, M. Operation and performance of the ATLAS semiconductor tracker 2014 Journal of Instrumentation 9 P08009 - 73pp details   doi
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