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Author NEXT Collaboration (Felkai, R. et al); Sorel, M.; Lopez-March, N.; Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Ferrario, P.; Laing, A.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Rodriguez, J.; Simon, A.; Torrent, J.; Yahlali, N.
Title Helium-Xenon mixtures to improve the topological signature in high pressure gas xenon TPCs Type Journal Article
Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A
Volume 905 Issue Pages 82-90
Keywords Helium; Xenon; Double-beta decay; TPC; Low diffusion; Electroluminescence
Abstract Within the framework of xenon-based double beta decay experiments, we propose the possibility to improve the background rejection of an electroluminescent Time Projection Chamber (EL TPC) by reducing the diffusion of the drifting electrons while keeping nearly intact the energy resolution of a pure xenon EL TPC. Based on state-of-the-art microscopic simulations, a substantial addition of helium, around 10 or 15 %, may reduce drastically the transverse diffusion down to 2.5 mm/root m from the 10.5 mm/root m of pure xenon. The longitudinal diffusion remains around 4 mm/root m. Light production studies have been performed as well. They show that the relative variation in energy resolution introduced by such a change does not exceed a few percent, which leaves the energy resolution practically unchanged. The technical caveats of using photomultipliers close to an helium atmosphere are also discussed in detail.
Address [Adams, C.; Guenette, R.; Martin-Albo, J.] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA, Email: francesc.monrabalcapilla@uta.edu
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0168-9002 ISBN Medium
Area Expedition Conference
Notes WOS:000444425700010 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3731
Permanent link to this record
 

 
Author NEXT Collaboration (McDonald, A.D. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Rodriguez, J.; Simon, A.; Sofka, C.; Sorel, M.; Torrent, J.; Yahlali, N.
Title Demonstration of Single-Barium-Ion Sensitivity for Neutrinoless Double-Beta Decay Using Single-Molecule Fluorescence Imaging Type Journal Article
Year 2018 Publication Physical Review Letters Abbreviated Journal Phys. Rev. Lett.
Volume 120 Issue 13 Pages 132504 - 6pp
Keywords
Abstract A new method to tag the barium daughter in the double-beta decay of Xe-136 is reported. Using the technique of single molecule fluorescent imaging (SMFI), individual barium dication (Ba++) resolution at a transparent scanning surface is demonstrated. A single-step photobleach confirms the single ion interpretation. Individual ions are localized with superresolution (similar to 2 nm), and detected with a statistical significance of 12.9 sigma over backgrounds. This lays the foundation for a new and potentially background-free neutrinoless double-beta decay technology, based on SMFI coupled to high pressure xenon gas time projection chambers.
Address [McDonald, A. D.; Jones, B. J. P.; Nygren, D. R.; Monrabal, F.; Rogers, L.] Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA, Email: austin.mcdonald@uta.edu;
Corporate Author Thesis
Publisher Amer Physical Soc Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN (down) 0031-9007 ISBN Medium
Area Expedition Conference
Notes WOS:000428243400005 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3538
Permanent link to this record