Author |
Title |
Year |
Publication |
Volume |
Pages |
NEXT Collaboration (Serra, L. et al); Sorel, M.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Querol, M.; Renner, J.; Rodriguez, J.; Simon, A.; Yahlali, N. |
An improved measurement of electron-ion recombination in high-pressure xenon gas |
2015 |
Journal of Instrumentation |
10 |
P03025 - 21pp |
NEXT Collaboration (Haefner, J. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Martin-Albo, J.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. |
Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness |
2023 |
Journal of Instrumentation |
18 |
P03016 - 21pp |
NEXT Collaboration (Alvarez, V. et al); Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gil, A.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Description and commissioning of NEXT-MM prototype: first results from operation in a Xenon-Trimethylamine gas mixture |
2014 |
Journal of Instrumentation |
9 |
P03010 - 22pp |
NEXT Collaboration (Alvarez, V. et al); Agramunt, J.; Ball, M.; Bayarri, J.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gil, A.; Gomez-Cadenas, J.J.; Gonzalez, K.; Liubarsky, I.; Lorca, D.; Martin-Albo, J.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Perez, J.; Rodriguez, J.; Serra, L.; Sorel, M.; Yahlali, N. |
SiPMs coated with TPB: coating protocol and characterization for NEXT |
2012 |
Journal of Instrumentation |
7 |
P02010 |
NEXT Collaboration (Renner, J. et al); Benlloch-Rodriguez, J.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Background rejection in NEXT using deep neural networks |
2017 |
Journal of Instrumentation |
12 |
T01004 - 21pp |