Author |
Title |
Year |
Publication |
Volume |
Pages ![sorted by First Page field, descending order (down)](img/sort_desc.gif) |
NEXT Collaboration (Simon, A. et al); Felkai, R.; Martinez-Lema, G.; Sorel, M.; Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Ferrario, P.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo Luque, C.; Torrent, J.; Yahlali, N. |
Electron drift properties in high pressure gaseous xenon |
2018 |
Journal of Instrumentation |
13 |
P07013 - 23pp |
Renner, J. et al; Romo-Luque, C.; Carrion, J.V.; Diaz, J.; Martinez, A.; Querol, M.; Rodriguez-Ponce, J.; Teruel-Pardo, S. |
Monte Carlo characterization of PETALO, a full-body liquid xenon-based PET detector |
2022 |
Journal of Instrumentation |
17 |
P05044 - 17pp |
NEXT Collaboration (Woodruff, K. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
Radio frequency and DC high voltage breakdown of high pressure helium, argon, and xenon |
2020 |
Journal of Instrumentation |
15 |
P04022 - 15pp |
NEXT Collaboration (Haefner, J. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Martin-Albo, J.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. |
Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness |
2023 |
Journal of Instrumentation |
18 |
P03016 - 21pp |
NEXT Collaboration (Renner, J. et al); Benlloch-Rodriguez, J.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Background rejection in NEXT using deep neural networks |
2017 |
Journal of Instrumentation |
12 |
T01004 - 21pp |