Author |
Title |
Year |
Publication |
Volume |
Pages |
Azevedo, C.D.R.; Baeza, A.; Chauveau, E.; Corbacho, J.A.; Diaz, J.; Domange, J.; Marquet, C.; Martinez-Roig, M.; Piquemal, F.; Prado, D.; Veloso, J.F.C.A.; Yahlali, N. |
Development of a real-time tritium-in-water monitor |
2023 |
Journal of Instrumentation |
18 |
T12008 - 14pp |
NEXT Collaboration (Ghosh, S. et al); Martin-Albo, J.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Lopez-March, N.; Martinez-Vara, M.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air |
2020 |
Journal of Instrumentation |
15 |
P11031 - 16pp |
NEXT Collaboration (Renner, J. et al); Martinez-Lema, G.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Rodriguez, J.; Romo-Luque, C.; Simon, A.; Sorel, M.; Yahlali, N. |
Initial results on energy resolution of the NEXT-White detector |
2018 |
Journal of Instrumentation |
13 |
P10020 - 14pp |
NEXT Collaboration (Martinez-Lema, G. et al); Palmeiro, B.; Botas, A.; Laing, A.; Renner, J.; Simon, A.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Perez, J.; Querol, M.; Rodriguez, J.; Romo-Lugue, C.; Sorel, M.; Torrent, J.; Yahlali, N. |
Calibration of the NEXT-White detector using Kr-83m decays |
2018 |
Journal of Instrumentation |
13 |
P10014 - 21pp |
NEXT Collaboration (Lorca, D. et al); Martin-Albo, J.; Laing, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Liubarsky, I.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Characterisation of NEXT-DEMO using xenon K-alpha X-rays |
2014 |
Journal of Instrumentation |
9 |
P10007 - 20pp |