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Author NEXT Collaboration (Azevedo, C.D.R. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N.
Title Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives Type Journal Article
Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A
Volume 877 Issue Pages (up) 157-172
Keywords Optical TPCs; Microscopic simulation; Xenon scintillation
Abstract We introduce a simulation framework for the transport of high and low energy electrons in xenon-based optical time projection chambers (OTPCs). The simulation relies on elementary cross sections (electron-atom and electron-molecule) and incorporates, in order to compute the gas scintillation, the reaction/quenching rates (atom-atom and atom-molecule) of the first 41 excited states of xenon and the relevant associated excimers, together with their radiative cascade. The results compare positively with observations made in pure xenon and its mixtures with CO2 and CF4 in a range of pressures from 0.1 to 10 bar. This work sheds some light on the elementary processes responsible for the primary and secondary xenon-scintillation mechanisms in the presence of additives, that are of interest to the OTPC technology.
Address [Azevedo, C. D. R.] Univ Aveiro, I3N, Phys Dept, Aveiro, Portugal, Email: Diego.Gonzalez.Diaz@usc.es
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-9002 ISBN Medium
Area Expedition Conference
Notes WOS:000415128000022 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3371
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Author Freitas, E.D.C.; Monteiro, C.M.B.; Ball, M.; Gomez-Cadenas, J.J.; Lopes, J.A.M.; Lux, T.; Sanchez, F.; dos Santos, J.M.F.
Title Secondary scintillation yield in high-pressure xenon gas for neutrinoless double beta decay (0 nu beta beta) search Type Journal Article
Year 2010 Publication Physics Letters B Abbreviated Journal Phys. Lett. B
Volume 684 Issue 4-5 Pages (up) 205-210
Keywords Neutrino; Neutrinoless double-beta decay; Secondary scintillation; Xenon; High-pressure
Abstract The search for neutrinoless double beta decay (0 nu beta beta) is an important topic in contemporary physics with many active experiments. New projects are planning to use high-pressure xenon gas as both source and detection medium. The secondary scintillation processes available in noble gases permit large amplification with negligible statistical fluctuations, offering the prospect of energy resolution approaching the Fano factor limit. This Letter reports results for xenon secondary scintillation yield, at room temperature, as a function of electric field in the gas scintillation gap for pressures ranging from 2 to 10 bar. A Large Area Avalanche Photodiode (LAAPD) collected the VUV secondary scintillation produced in the gas. X-rays directly absorbed in the LAAPD are used as a reference for determining the number of charge carriers produced by the scintillation pulse and, hence, the number of photons impinging the LAAPD. The number of photons produced per drifting electron and per kilovolt, the so-called scintillation amplification parameter, displays a small increase with pressure, ranging from 141 +/- 6 at 2 bar to 170 +/- 10 at 8 bar. In our setup, this Parameter does not increase above 8 bar due to nonnegligible electron attachment. The results are in good agreement with those presented in the literature in the 1 to 3 bar range. The increase of the scintillation amplification parameter with pressure for high gas densities has been also observed in former work at cryogenic temperatures.
Address [Freitas, E. D. C.; Monteiro, C. M. B.; Lopes, J. A. M.; dos Santos, J. M. F.] Univ Coimbra, GIAN CI, Dept Fis, P-3004516 Coimbra, Portugal, Email: jmf@gian.fis.uc.pt
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0370-2693 ISBN Medium
Area Expedition Conference
Notes ISI:000275009600006 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ elepoucu @ Serial 487
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Author Herrero, V.; Toledo, J.; Catala, J.M.; Esteve, R.; Gil, A.; Lorca, D.; Monzo, J.M.; Sanchis, F.; Verdugo, A.
Title Readout electronics for the SiPM tracking plane in the NEXT-1 prototype Type Journal Article
Year 2012 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A
Volume 695 Issue Pages (up) 229-232
Keywords Neutrino less double beta decay; Xenon gas TPC; SiPM readout; Front-end electronics; Gated integrator
Abstract NEXT is a new experiment to search for neutrinoless double beta decay using a 100 kg radio-pure high-pressure gaseous xenon TPC with electroluminescence readout. A large-scale prototype with a SiPM tracking plane has been built. The primary electron paths can be reconstructed from time-resolved measurements of the light that arrives to the SiPM plane. Our approach is to measure how many photons have reached each SiPM sensor each microsecond with a gated integrator. We have designed and tested a 16-channel front-end board that includes the analog paths and a digital section. Each analog path consists of three different stages: a transimpedance amplifier, a gated integrator and an offset and gain control stage. Measurements show good linearity and the ability to detect single photoelectrons.
Address [Herrero, V.; Toledo, J.; Catala, J. M.; Esteve, R.; Monzo, J. M.; Sanchis, F.] Univ Politecn Valencia, CIEMAT, Ctr Mixto, I3M, Valencia 46022, Spain, Email: jtoledo@eln.upv.es
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-9002 ISBN Medium
Area Expedition Conference
Notes WOS:000311469900049 Approved no
Is ISI yes International Collaboration no
Call Number IFIC @ pastor @ Serial 1237
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Author Gil, A.; Diaz, J.; Gomez-Cadenas, J.J.; Herrero, V.; Rodriguez, J.; Serra, L.; Toledo, J.; Esteve, R.; Monzo, J.M.; Monrabal, F.; Yahlali, N.
Title Front-end electronics for accurate energy measurement of double beta decays Type Journal Article
Year 2012 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A
Volume 695 Issue Pages (up) 407-409
Keywords Front-end electronics; Xenon gas TPC; Energy measurement; Electroluminiscence; Double-beta decay
Abstract NEXT, a double beta decay experiment that will operate in Canfranc Underground Laboratory (Spain), aims at measuring the neutrinoless double-beta decay of the 136Xe isotope using a TPC filled with enriched Xenon gas at high pressure operated in electroluminescence mode. One technological challenge of the experiment is to achieve resolution better than 1% in the energy measurement using a plane of UV sensitive photomultipliers readout with appropriate custom-made front-end electronics. The front-end is designed to be sensitive to the single photo-electron to detect the weak primary scintillation light produced in the chamber, and also to be able to cope with the electroluminescence signal (several hundred times higher and with a duration of microseconds). For efficient primary scintillation detection and precise energy measurement of the electroluminescent signals the front-end electronics features low noise and adequate amplification. The signal shaping provided allows the digitization of the signals at a frequency as low as 40 MHz.
Address [Gil, A.; Diaz, J.; Gomez-Cadenas, J. J.; Rodriguez, J.; Serra, L.; Monrabal, F.; Yahlali, N.] Inst Fis Corpuscular CSIC UV, Valencia 46071, Spain, Email: alejandro.gil@ific.uv.es
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-9002 ISBN Medium
Area Expedition Conference
Notes WOS:000311469900092 Approved no
Is ISI yes International Collaboration no
Call Number IFIC @ pastor @ Serial 1238
Permanent link to this record
 

 
Author NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N.
Title Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection Type Journal Article
Year 2017 Publication Physics Letters B Abbreviated Journal Phys. Lett. B
Volume 773 Issue Pages (up) 663-671
Keywords Double beta decay; Neutrino; Rare event detection; Electroluminescence; Secondary scintillation; Xenon
Abstract Xe-CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO2 to pure xenon at the level of 0.05-0.1% can reduce significantly the scale of electron diffusion from 10 mm/root m to 2.5 mm/root m, with high impact on the discrimination of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe-CO2 mixtures, with sub-percent CO2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO2.
Address [Henriques, C. A. O.; Freitas, E. D. C.; Mano, R. D. P.; Jorge, M. R.; Fernandes, L. M. P.; Monteiro, C. M. B.; dos Santos, J. M. F.] Univ Coimbra, Phys Dept, LIBPhys, Rua Larga, P-3004516 Coimbra, Portugal, Email: cristina@gian.fis.uc.pt
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0370-2693 ISBN Medium
Area Expedition Conference
Notes WOS:000413294200099 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3342
Permanent link to this record