| Author |
Title |
Year |
Publication |
Volume |
Pages  |
| NEXT Collaboration (Renner, J. et al); Kekic, M.; Martinez-Lema, G.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Herrero, P.; Lopez-March, N.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
Energy calibration of the NEXT-White detector with 1% resolution near Q(beta beta) of Xe-136 |
2019 |
Journal of High Energy Physics |
10 |
230 - 13pp |
| NEXT Collaboration (Haefner, J. et al); Carcel, S.; Carrion, J.V.; Lopez-March, N.; Martin-Albo, J.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Soto-Oton, J.; Uson, A. |
Demonstration of event position reconstruction based on diffusion in the NEXT-white detector |
2024 |
European Physical Journal C |
84 |
518 - 13pp |
| NEXT Collaboration (Henriques, C.A.O. et al); Gomez-Cadenas, J.J.; Alvarez, V.; Benlloch-Rodriguez, J.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. |
Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection |
2017 |
Physics Letters B |
773 |
663-671 |
| Esteve, R.; Toledo, J.F.; Herrero, V.; Simon, A.; Monrabal, F.; Alvarez, V.; Rodriguez, J.; Querol, M.; Ballester, F. |
The Event Detection System in the NEXT-White Detector |
2021 |
Sensors |
21 |
673 - 18pp |
| NEXT Collaboration (Renner, J. et al); Benlloch-Rodriguez, J.; Botas, A.; Ferrario, P.; Gomez-Cadenas, J.J.; Alvarez, V.; Carcel, S.; Carrion, J.V.; Cervera-Villanueva, A.; Diaz, J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martinez, A.; Monrabal, F.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Background rejection in NEXT using deep neural networks |
2017 |
Journal of Instrumentation |
12 |
T01004 - 21pp |
