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Author (up) NEXT Collaboration (Monrabal, F. et al); Laing, A.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Felkai, R.; Martinez, A.; Musti, M.; Querol, M.; Rodriguez, J.; Simon, A.; Torrent, J.; Botas, A.; Diaz, J.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Romo-Luque, C.; Sorel, M.; Yahlali, N. url  doi
openurl 
  Title The NEXT White (NEW) detector Type Journal Article
  Year 2018 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 13 Issue Pages P12010 - 38pp  
  Keywords Double-beta decay detectors; Particle tracking detectors; Scintillators; scintillation and light emission processes (solid gas and liquid scintillators); Time projection chambers  
  Abstract Conceived to host 5 kg of xenon at a pressure of 15 bar in the fiducial volume, the NEXT-White apparatus is currently the largest high pressure xenon gas TPC using electroluminescent amplification in the world. It is also a 1:2 scale model of the NEXT-100 detector for Xe-136 beta beta 0 nu decay searches, scheduled to start operations in 2019. Both detectors measure the energy of the event using a plane of photomultipliers located behind a transparent cathode. They can also reconstruct the trajectories of charged tracks in the dense gas of the TPC with the help of a plane of silicon photomultipliers located behind the anode. A sophisticated gas system, common to both detectors, allows the high gas purity needed to guarantee a long electron lifetime. NEXT-White has been operating since October 2016 at the Laboratorio Subterraneo de Canfranc (LSC), in Spain. This paper describes the detector and associated infrastructures, as well as the main aspects of its initial operation.  
  Address [Ouero, M.; Hauptman, J.] Iowa State Univ, Dept Phys & Astron, 12 Phys Hall, Ames, IA 50011 USA, Email: monrabal18@gmail.com  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000452463500001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3833  
Permanent link to this record
 

 
Author (up) Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y. url  doi
openurl 
  Title Mapping the depleted area of silicon diodes using a micro-focused X-ray beam Type Journal Article
  Year 2019 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 14 Issue Pages P03024 - 14pp  
  Keywords Si microstrip and pad detectors; Detector design and construction technologies and materials; Particle tracking detectors (Solid-state detectors); Radiation-hard detectors  
  Abstract For the Phase-II Upgrade of the ATLAS detector at CERN, the current ATLAS Inner Detector will be replaced with the ATLAS Inner Tracker (ITk). The ITk will be an all-silicon detector, consisting of a pixel tracker and a strip tracker. Sensors for the ITk strip tracker are required to have a low leakage current up to bias voltages of 500V to maintain a low noise and power dissipation. In order to minimise sensor leakage currents, particularly in the high-radiation environment inside the ATLAS detector, sensors are foreseen to be operated at low temperatures and to be manufactured from wafers with a high bulk resistivity of several k Omega.cm. Simulations showed the electric field inside sensors with high bulk resistivity to extend towards the sensor edge, which could lead to increased surface currents for narrow dicing edges. In order to map the electric field inside biased silicon sensors with high bulk resistivity, three diodes from ATLAS silicon strip sensor prototype wafers were studied with a monochromatic, micro-focused X-ray beam at the Diamond Light Source (Didcot, U.K.). For all devices under investigation, the electric field inside the diode was mapped and its dependence on the applied bias voltage was studied.  
  Address [Poley, L.] Lawrence Berkeley Natl Lab, Cyclotron Rd, Berkeley, CA 94720 USA, Email: Anne-Luise.Poley@desy.de  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000463330900012 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 3973  
Permanent link to this record
 

 
Author (up) Poley, L.; Stolzenberg, U.; Schwenker, B.; Frey, A.; Gottlicher, P.; Marinas, C.; Stanitzki, M.; Stelzer, B. doi  openurl
  Title Mapping the material distribution of a complex structure in an electron beam Type Journal Article
  Year 2021 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 16 Issue 1 Pages P01010 - 33pp  
  Keywords Detector modelling and simulations I (interaction of radiation with matter, interaction of photons with matter, interaction of hadrons with matter, etc); Particle tracking detectors; Detector design and construction technologies and materials  
  Abstract The simulation and analysis of High Energy Physics experiments require a realistic simulation of the detector material and its distribution. The challenge is to describe all active and passive parts of large scale detectors like ATLAS in terms of their size, position and material composition. The common method for estimating the radiation length by weighing individual components, adding up their contributions and averaging the resulting material distribution over extended structures provides a good general estimate, but can deviate significantly from the material actually present. A method has been developed to assess its material distribution with high spatial resolution using the reconstructed scattering angles and hit positions of high energy electron tracks traversing an object under investigation. The study presented here shows measurements for an extended structure with a highly inhomogeneous material distribution. The structure under investigation is an End-of-Substructure-card prototype designed for the ATLAS Inner Tracker strip tracker – a PCB populated with components of a large range of material budgets and sizes. The measurements presented here summarise requirements for data samples and reconstructed electron tracks for reliable image reconstruction of large scale, inhomogeneous samples, choices of pixel sizes compared to the size of features under investigation as well as a bremsstrahlung correction for high material densities and thicknesses.  
  Address [Poley, L.; Stelzer, B.] Simon Fraser Univ, Dept Phys, Univ Dr, Burnaby, BC, Canada, Email: APoley@cern.ch  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000608273000010 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 4687  
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Author (up) Renner, J.; Cervera-Villanueva, A.; Hernando, J.A.; Izmaylov, A.; Monrabal, F.; Muñoz, J.; Nygren, D.; Gomez-Cadenas, J.J. url  doi
openurl 
  Title Improved background rejection in neutrinoless double beta decay experiments using a magnetic field in a high pressure xenon TPC Type Journal Article
  Year 2015 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 10 Issue Pages P12020 - 19pp  
  Keywords Pattern recognition, cluster finding, calibration and fitting methods; Double-beta decay detectors; Time projection chambers; Particle tracking detectors (Gaseous detectors)  
  Abstract We demonstrate that the application of an external magnetic field could lead to an improved background rejection in neutrinoless double-beta (0 nu beta beta) decay experiments using a high-pressure xenon (HPXe) TPC. HPXe chambers are capable of imaging electron tracks, a feature that enhances the separation between signal events (the two electrons emitted in the 0 nu beta beta decay of Xe-136) and background events, arising chiefly from single electrons of kinetic energy compatible with the end-point of the 0 nu beta beta decay (Q(beta beta)). Applying an external magnetic field of sufficiently high intensity (in the range of 0.5-1 Tesla for operating pressures in the range of 5-15 atmospheres) causes the electrons to produce helical tracks. Assuming the tracks can be properly reconstructed, the sign of the curvature can be determined at several points along these tracks, and such information can be used to separate signal (0 nu beta beta) events containing two electrons producing a track with two different directions of curvature from background (single-electron) events producing a track that should spiral in a single direction. Due to electron multiple scattering, this strategy is not perfectly efficient on an event-by-event basis, but a statistical estimator can be constructed which can be used to reject background events by one order of magnitude at a moderate cost (about 30%) in signal efficiency. Combining this estimator with the excellent energy resolution and topological signature identification characteristic of the HPXe TPC, it is possible to reach a background rate of less than one count per ton-year of exposure. Such a low background rate is an essential feature of the next generation of 0 nu beta beta experiments, aiming to fully explore the inverse hierarchy of neutrino masses.  
  Address [Renner, J.; Imzaylov, A.; Monrabal, F.; Munoz, J.; Gomez-Cadenas, J. J.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, Valencia 46980, Spain, Email: jrenner@ific.uv.es  
  Corporate Author Thesis  
  Publisher Iop Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000369998500053 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 2549  
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Author (up) Schreeck, H.; Paschen, B.; Wieduwilt, P.; Ahlburg, P.; Andricek, L.; Dingfelder, J.; Frey, A.; Lutticke, F.; Marinas, C.; Richter, R.; Schwenker, B. doi  openurl
  Title Effects of gamma irradiation on DEPFET pixel sensors for the Belle II experiment Type Journal Article
  Year 2020 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 959 Issue Pages 163522 - 9pp  
  Keywords DEPFET; Radiation damage; Particle tracking detectors; Belle II  
  Abstract For the Belle II experiment at KEK (Tsukuba, Japan) the KEKB accelerator was upgraded to deliver a 40 times larger instantaneous luminosity than before, which requires an increased radiation hardness of the detector components. As the innermost part of the Belle II detector, the pixel detector (PXD), based on DEPFET (DEpleted P-channel Field Effect Transistor) technology, is most exposed to radiation from the accelerator. An irradiation campaign was performed to verify that the PXD can cope with the expected amount of radiation. We present the results of this measurement campaign in which an X-ray machine was used to irradiate a single PXD half-ladder to a total dose of 266 kGy. The half-ladder is from the same batch as the half-ladders used for Belle II. According to simulations, the total accumulated dose corresponds to 7-10 years of Belle II operation. While individual components have been irradiated before, this campaign is the first full system irradiation. We discuss the effects on the DEPFET sensors, as well as the performance of the front-end electronics. In addition, we present efficiency studies of the half-ladder from beam tests performed before and after the irradiation.  
  Address [Schreeck, Harrison; Wieduwilt, Philipp; Frey, Ariane; Schwenker, Benjamin] Georg August Univ Gottingen, Phys Inst 2, Friedrich Hund Pl 1, D-37077 Gottingen, Germany, Email: harrison.schreeck@phys.uni-goettingen.de  
  Corporate Author Thesis  
  Publisher Elsevier Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000518368800016 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 4316  
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Author (up) Unno, Y. et al; Bernabeu, J.; Lacasta, C.; Solaz, C.; Soldevila, U. doi  openurl
  Title Specifications and pre-production of n plus -in-p large-format strip sensors fabricated in 6-inch silicon wafers, ATLAS18, for the Inner Tracker of the ATLAS Detector for High-Luminosity Large Hadron Collider Type Journal Article
  Year 2023 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.  
  Volume 18 Issue 3 Pages T03008 - 29pp  
  Keywords Particle tracking detectors (Solid-state detectors); Radiation-hard detectors; Si microstrip and pad detectors  
  Abstract The ATLAS experiment is constructing new all-silicon inner tracking system for HL-LHC. The strip detectors cover the radial extent of 40 to 100 cm. A new approach is adopted to use p-type silicon material, making the readout in n+-strips, so-called n+-in-p sensors. This allows for enhanced radiation tolerance against an order of magnitude higher particle fluence compared to the LHC. To cope with varying hit rates and occupancies as a function of radial distance, there are two barrel sensor types, the short strips (SS) for the inner 2 and the long strips (LS) for the outer 2 barrel cylinders, respectively. The barrel sensors exhibit a square, 9.8 x 9.8 cm2, geometry, the largest possible sensor area from a 6-inch wafer. The strips are laid out in parallel with a strip pitch of 75.5 μm and 4 or 2 rows of strip segments. The strips are AC-coupled and biased via polysilicon resistors. The endcap sensors employ a “stereo-annulus” geometry exhibiting a skewed-trapezoid shapes with circular edges. They are designed in 6 unique shapes, R0 to R5, corresponding to progressively increasing radial extents and which allows them to fit within the petal geometry and the 6-inch wafer maximally. The strips are in fan-out geometry with an in-built rotation angle, with a mean pitch of approximately 75 μm and 4 or 2 rows of strip segments. The eight sensor types are labeled as ATLAS18xx where xx stands for SS, LS, and R0 to R5. According to the mechanical and electrical specifications, CAD files for wafer processing were laid out, following the successful designs of prototype barrel and endcap sensors, together with a number of optimizations. A pre-production was carried out prior to the full production of the wafers. The quality of the sensors is reviewed and judged excellent through the test results carried out by vendor. These sensors are used for establishing acceptance procedures and to evaluate their performance in the ATLAS collaboration, and subsequently for pre-production of strip modules and stave and petal structures.  
  Address [Allport, P. P.; Chisholm, A.; George, W.; Gonella, L.; Kopsalis, I.; Lomas, J.] Univ Birmingham, Sch Phys & Astron, Birmingham B152TT, England, Email: yoshinobu.unno@kek.jp  
  Corporate Author Thesis  
  Publisher IOP Publishing Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1748-0221 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000974242700001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5522  
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