Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Title |
Year |
Publication |
Volume |
Pages |
NEXT Collaboration (Monrabal, F. et al); Laing, A.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Felkai, R.; Martinez, A.; Musti, M.; Querol, M.; Rodriguez, J.; Simon, A.; Torrent, J.; Botas, A.; Diaz, J.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Romo-Luque, C.; Sorel, M.; Yahlali, N. |
The NEXT White (NEW) detector |
2018 |
Journal of Instrumentation |
13 |
P12010 - 38pp |
NEXT Collaboration (Rogers, L. et al); Alvarez, V.; Benlloch-Rodriguez, J.M.; Botas, A.; Carcel, S.; Carrion, J.V.; Diaz, J.; Felkai, R.; Ferrario, P.; Gomez-Cadenas, J.J.; Kekic, M.; Laing, A.; Lopez-March, N.; Martinez, A.; Martinez-Lema, G.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Querol, M.; Renner, J.; Rodriguez, J.; Romo-Luque, C; Simon, A.; Sorel, M.; Torrent, J.; Yahlali, N. |
High voltage insulation and gas absorption of polymers in high pressure argon and xenon gases |
2018 |
Journal of Instrumentation |
13 |
P10002 - 19pp |
NEXT Collaboration; Carcel, S.; Carrion, J.V.; Felkai, R.; Kekic, M.; Lopez-March, N.; Martin-Albo, J.; Martinez, A.; Martinez-Lema, G.; Muñoz Vidal, J.; Novella, P.; Palmeiro, B.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A.; Yahlali, N. |
Mitigation of backgrounds from cosmogenic Xe-137 in xenon gas experiments using He-3 neutron capture |
2020 |
Journal of Physics G |
47 |
075001 - 17pp |
Oliveira, C.A.B.; Sorel, M.; Martin-Albo, J.; Gomez-Cadenas, J.J.; Ferreira, A.L.; Veloso, J.F.C.A. |
Energy resolution studies for NEXT |
2011 |
Journal of Instrumentation |
6 |
P05007 - 13pp |
Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y. |
Mapping the depleted area of silicon diodes using a micro-focused X-ray beam |
2019 |
Journal of Instrumentation |
14 |
P03024 - 14pp |