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Author  |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
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NEXT Collaboration (Byrnes, N.K. et al); Carcel, S.; Carrion, J.V.; Lopez, F.; Lopez-March, N.; Martin-Albo, J.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. |
NEXT-CRAB-0: a high pressure gaseous xenon time projection chamber with a direct VUV camera based readout |
2023 |
Journal of Instrumentation |
18 |
P08006 - 33pp |
|
|
|
NEXT Collaboration (Cebrian, S. et al); Alvarez, V.; Carcel, S.; Cervera-Villanueva, A.; Diaz, J.; Ferrario, P.; Gomez-Cadenas, J.J.; Laing, A.; Liubarsky, I.; Lopez-March, N.; Lorca, D.; Martin-Albo, J.; Martinez, A.; Monrabal, F.; Monserrate, M.; Muñoz Vidal, J.; Nebot-Guinot, M.; Querol, M.; Rodriguez, J.; Serra, L.; Simon, A.; Sorel, M.; Yahlali, N. |
Radiopurity assessment of the tracking readout for the NEXT double beta decay experiment |
2015 |
Journal of Instrumentation |
10 |
P05006 - 16pp |
|
|
|
NEXT Collaboration (Haefner, J. et al); Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Martin-Albo, J.; Martinez-Vara, M.; Muñoz Vidal, J.; Novella, P.; Querol, M.; Romo-Luque, C.; Sorel, M.; Uson, A. |
Reflectance and fluorescence characteristics of PTFE coated with TPB at visible, UV, and VUV as a function of thickness |
2023 |
Journal of Instrumentation |
18 |
P03016 - 21pp |
|
|
|
NEXT Collaboration (Monrabal, F. et al); Laing, A.; Alvarez, V.; Benlloch-Rodriguez, J.M.; Carcel, S.; Carrion, J.V.; Felkai, R.; Martinez, A.; Musti, M.; Querol, M.; Rodriguez, J.; Simon, A.; Torrent, J.; Botas, A.; Diaz, J.; Kekic, M.; Lopez-March, N.; Martinez-Lema, G.; Muñoz Vidal, J.; Nebot-Guinot, M.; Novella, P.; Palmeiro, B.; Perez, J.; Renner, J.; Romo-Luque, C.; Sorel, M.; Yahlali, N. |
The NEXT White (NEW) detector |
2018 |
Journal of Instrumentation |
13 |
P12010 - 38pp |
|
|
|
Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y. |
Mapping the depleted area of silicon diodes using a micro-focused X-ray beam |
2019 |
Journal of Instrumentation |
14 |
P03024 - 14pp |
|
