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Author (up) Belle-II DEPFET and PXD Collaborations (Wang, B. et al); Marinas, C. doi  openurl
  Title Operational experience of the Belle II pixel detector Type Journal Article
  Year 2022 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 1032 Issue Pages 166631 - 7pp  
  Keywords Belle II PXD; DEPFET; Pixel detector; Vertex detector  
  Abstract The Belle II experiment at the SuperKEKB accelerator has started its physics data taking with the full detector setup in March 2019. It aims to collect 40 times more e+e- collision data compared with its predecessor Belle experiment. The Belle II pixel detector (PXD) is based on the Depleted P-channel Field Effect Transistor (DEPFET) technology. The PXD plays an important role in the tracking and vertexing of the Belle II detector. Its two layers are arranged at radii of 14 mm and 22 mm around the interaction point. The sensors are thinned down to 75 μm to minimize multiple scattering, and each module has interconnects and ASICs integrated on the sensor with silicon frames for mechanical support. PXD showed good performance during data taking. It also faces several operational challenges due to the high background level from the SuperKEKB accelerator, such as the damage from beam loss events, the drift in the HV working point due to radiation effect, and the impact of the high background.  
  Address [Alonso, O.; Dieguez, A.] Univ Barcelona, C Marti Franques 1, Barcelona 08028, Spain, Email: wang@mpp.mpg.de  
  Corporate Author Thesis  
  Publisher Elsevier Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000793768200001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5227  
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Author (up) Boronat, M.; Marinas, C.; Frey, A.; Garcia, I.; Schwenker, B.; Vos, M.; Wilk, F. url  doi
openurl 
  Title Physical Limitations to the Spatial Resolution of Solid-State Detectors Type Journal Article
  Year 2015 Publication IEEE Transactions on Nuclear Science Abbreviated Journal IEEE Trans. Nucl. Sci.  
  Volume 62 Issue 1 Pages 381-386  
  Keywords Charged particle tracking; silicon detectors; solid state devices  
  Abstract In this paper we explore the effect of delta-ray emission and fluctuations in the signal deposition on the detection of charged particles in silicon-based detectors. We show that these two effects ultimately limit the resolution that can be achieved by interpolation of the signal in finely segmented position-sensitive solid-state devices.  
  Address [Boronat, M.; Garcia, I.; Vos, M.] IFIC UVEG CSIC, E-46980 Valencia, Spain, Email: marcel.vos@ific.uv.es  
  Corporate Author Thesis  
  Publisher Ieee-Inst Electrical Electronics Engineers Inc Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0018-9499 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000349672900025 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 2140  
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Author (up) Liptak, Z. et al; Marinas, C. url  doi
openurl 
  Title Measurements of beam backgrounds in SuperKEKB Phase 2 Type Journal Article
  Year 2022 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 1040 Issue Pages 167168 - 19pp  
  Keywords  
  Abstract The high design luminosity of the SuperKEKB electron–positron collider will result in challenging levels of beam-induced backgrounds in the interaction region. Understanding and mitigating these backgrounds is critical to the success of the Belle II experiment. We report on the first background measurements performed after roll-in of the Belle II detector, a period known as SuperKEKB Phase 2, utilizing both the BEAST II system of dedicated background detectors and the Belle II detector itself. We also report on first revisions to the background simulation made in response to our findings. Backgrounds measured include contributions from synchrotron radiation, beam-gas, Touschek, and injection backgrounds. At the end of Phase 2, single-beam backgrounds originating from the 4 GeV positron Low Energy Ring (LER) agree reasonably well with simulation, while backgrounds from the 7 GeV electron High Energy Ring (HER) are approximately one order of magnitude higher than simulation. We extrapolate these backgrounds forward and conclude it is safe to install the Belle II vertex detector.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5496  
Permanent link to this record
 

 
Author (up) Marinas, C.; Vos, M. doi  openurl
  Title The Belle-II DEPFET pixel detector: A step forward in vertexing in the superKEKB flavour factory Type Journal Article
  Year 2011 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 650 Issue 1 Pages 59-63  
  Keywords SuperKEKB; Belle-II; DEPFET; Pixel detector; ASIC; Mechanics; Cooling; Resolution  
  Abstract An upgrade of the successful asymmetric e(+)e(-) collider in KEK (Tsukuba, Japan) is foreseen by the fall of 2013. This new Super Flavor Factory will deliver an increased instantaneous luminosity of up to L = 8 x 10(35) cm(-2) s(-1), 40 times larger than the current KEKB machine. To exploit these new conditions and provide high precision measurements of the decay vertex of the B meson systems, a new silicon vertex detector will be operated in Belle. This new detector will consist of two layers of DEPFET Active Pixel Sensors as close as possible to the interaction point. DEPFET is a field effect transistor, with an additional deep implant underneath the channel's gate, integrated on a completely depleted bulk. This technology offers detection and an in-pixel amplification stage, while keeping low the power consumption. Under these conditions, thin sensors with small pixel size and low intrinsic noise are possible. In this article, an overview of the full system will be described, including the sensor, the front-end electronics and both the mechanical and thermal proposed solutions as well as the expected performance.  
  Address [Marinas, C; Vos, M] CSIC UVEG, IFIC, Inst Fis Corpuscular, Valencia, Spain, Email: Carlos.Marinas.Pardo@cern.ch  
  Corporate Author Thesis  
  Publisher Elsevier Science Bv Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000295106500015 Approved no  
  Is ISI yes International Collaboration no  
  Call Number IFIC @ elepoucu @ Serial 768  
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Author (up) Natochii, A. et al; Marinas, C. url  doi
openurl 
  Title Measured and projected beam backgrounds in the Belle II experiment at the SuperKEKB collider Type Journal Article
  Year 2023 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A  
  Volume 1055 Issue Pages 168550 - 21pp  
  Keywords Detector background; Lepton collider; Monte-Carlo simulation  
  Abstract The Belle II experiment at the SuperKEKB electron-positron collider aims to collect an unprecedented data set of 50 ab-1 to study CP-violation in the B-meson system and to search for Physics beyond the Standard Model. SuperKEKB is already the world's highest-luminosity collider. In order to collect the planned data set within approximately one decade, the target is to reach a peak luminosity of 6 x 1035 cm-2 s-1by further increasing the beam currents and reducing the beam size at the interaction point by squeezing the betatron function down to betay* = 0.3 mm. To ensure detector longevity and maintain good reconstruction performance, beam backgrounds must remain well controlled. We report on current background rates in Belle II and compare these against simulation. We find that a number of recent refinements have significantly improved the background simulation accuracy. Finally, we estimate the safety margins going forward. We predict that backgrounds should remain high but acceptable until a luminosity of at least 2.8 x 1035 cm-2 s-1is reached for betay* = 0.6 mm. At this point, the most vulnerable Belle II detectors, the Time-of-Propagation (TOP) particle identification system and the Central Drift Chamber (CDC), have predicted background hit rates from single-beam and luminosity backgrounds that add up to approximately half of the maximum acceptable rates.  
  Address [Natochii, A.; Browder, T. E.; Schueler, J.; Vahsen, S. E.] Univ Hawaii, Honolulu, HI 96822 USA, Email: natochii@hawaii.edu;  
  Corporate Author Thesis  
  Publisher Elsevier Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-9002 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:001056103200001 Approved no  
  Is ISI yes International Collaboration yes  
  Call Number IFIC @ pastor @ Serial 5626  
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