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Author  |
Title | Year | Publication | Volume | Pages |
|---|---|---|---|---|---|
| Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y. | Mapping the depleted area of silicon diodes using a micro-focused X-ray beam | 2019 | Journal of Instrumentation | 14 | P03024 - 14pp |