Author |
Title |
Year |
Publication |
Volume |
Pages |
Quintero-Quintero, A.; Patiño-Camargo, G.; Soriano, A.; Palma, J.D.; Vilar-Palop, J.; Pujades, M.C.; Llorca-Domaica, N.; Ballester, F.; Vijande, J.; Candela-Juan, C. |
Calibration of a thermoluminescent dosimeter worn over lead aprons in fluoroscopy guided procedures |
2018 |
Journal of Radiological Protection |
38 |
549-563 |
Qin, W.; Dai, L.Y.; Portoles, J. |
Two and three pseudoscalar production in e(+)e(-) annihilation and their contributions to (g-2)(mu) |
2021 |
Journal of High Energy Physics |
03 |
092 - 38pp |
n_TOF Collaboration (Praena, J. et al); Domingo-Pardo, C.; Giubrone, G.; Tain, J.L.; Tarifeño-Saldivia, A. |
Measurement and resonance analysis of the S-33(n,alpha)Si-30 cross section at the CERN n_TOF facility in the energy region from 10 to 300 keV |
2018 |
Physical Review C |
97 |
064603 - 10pp |
n_TOF Collaboration (Praena, J. et al); Domingo-Pardo, C.; Giubrone, G.; Tain, J.L.; Tarifeño-Saldivia, A. |
Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n_TOF facility at CERN |
2018 |
Nuclear Instruments & Methods in Physics Research A |
890 |
142-147 |
Portillo-Sanchez, D.; Escribano, P.; Vicente, A. |
Ultraviolet extensions of the Scotogenic model |
2023 |
Journal of High Energy Physics |
08 |
023 - 35pp |
Pompa, F.; Schwetz, T.; Zhu, J.Y. |
Impact of nuclear matrix element calculations for current and future neutrinoless double beta decay searches |
2023 |
Journal of High Energy Physics |
06 |
104 - 29pp |
Pompa, F.; Mena, O. |
How long do neutrinos live and how much do they weigh? |
2024 |
European Physical Journal C |
84 |
134 - 12pp |
Pompa, F.; Capozzi, F.; Mena, O.; Sorel, M. |
Absolute nu Mass Measurement with the DUNE Experiment |
2022 |
Physical Review Letters |
129 |
121802 - 6pp |
Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y. |
Mapping the depleted area of silicon diodes using a micro-focused X-ray beam |
2019 |
Journal of Instrumentation |
14 |
P03024 - 14pp |
Poley, L.; Stolzenberg, U.; Schwenker, B.; Frey, A.; Gottlicher, P.; Marinas, C.; Stanitzki, M.; Stelzer, B. |
Mapping the material distribution of a complex structure in an electron beam |
2021 |
Journal of Instrumentation |
16 |
P01010 - 33pp |