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Author Renner, J.; Cervera-Villanueva, A.; Hernando, J.A.; Izmaylov, A.; Monrabal, F.; Muñoz, J.; Nygren, D.; Gomez-Cadenas, J.J.
Title Improved background rejection in neutrinoless double beta decay experiments using a magnetic field in a high pressure xenon TPC Type Journal Article
Year 2015 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 10 Issue Pages P12020 - 19pp
Keywords Pattern recognition, cluster finding, calibration and fitting methods; Double-beta decay detectors; Time projection chambers; Particle tracking detectors (Gaseous detectors)
Abstract We demonstrate that the application of an external magnetic field could lead to an improved background rejection in neutrinoless double-beta (0 nu beta beta) decay experiments using a high-pressure xenon (HPXe) TPC. HPXe chambers are capable of imaging electron tracks, a feature that enhances the separation between signal events (the two electrons emitted in the 0 nu beta beta decay of Xe-136) and background events, arising chiefly from single electrons of kinetic energy compatible with the end-point of the 0 nu beta beta decay (Q(beta beta)). Applying an external magnetic field of sufficiently high intensity (in the range of 0.5-1 Tesla for operating pressures in the range of 5-15 atmospheres) causes the electrons to produce helical tracks. Assuming the tracks can be properly reconstructed, the sign of the curvature can be determined at several points along these tracks, and such information can be used to separate signal (0 nu beta beta) events containing two electrons producing a track with two different directions of curvature from background (single-electron) events producing a track that should spiral in a single direction. Due to electron multiple scattering, this strategy is not perfectly efficient on an event-by-event basis, but a statistical estimator can be constructed which can be used to reject background events by one order of magnitude at a moderate cost (about 30%) in signal efficiency. Combining this estimator with the excellent energy resolution and topological signature identification characteristic of the HPXe TPC, it is possible to reach a background rate of less than one count per ton-year of exposure. Such a low background rate is an essential feature of the next generation of 0 nu beta beta experiments, aiming to fully explore the inverse hierarchy of neutrino masses.
Address (down) [Renner, J.; Imzaylov, A.; Monrabal, F.; Munoz, J.; Gomez-Cadenas, J. J.] CSIC, Inst Fis Corpuscular IFIC, Calle Catedrat Jose Beltran 2, Valencia 46980, Spain, Email: jrenner@ific.uv.es
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000369998500053 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 2549
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Author Rebel, B.; Hall, C.; Bernard, E.; Faham, C.H.; Ito, T.M.; Lundberg, B.; Messina, M.; Monrabal, F.; Pereverzev, S.P.; Resnati, F.; Rowson, P.C.; Soderberg, M.; Strauss, T.; Tomas, A.; Va'vra, J.; Wang, H.
Title High voltage in noble liquids for high energy physics Type Journal Article
Year 2014 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 9 Issue Pages T08004 - 57pp
Keywords Noble liquid detectors (scintillation, ionization, double-phase); Neutrino detectors; Neutron detectors (cold, thermal, fast neutrons); Dark Matter detectors (WIMPs, axions, etc.)
Abstract A workshop was held at Fermilab November 8-9, 2013 to discuss the challenges of using high voltage in noble liquids. The participants spanned the fields of neutrino, dark matter, and electric dipole moment physics. All presentations at the workshop were made in plenary sessions. This document summarizes the experiences and lessons learned from experiments in these fields at developing high voltage systems in noble liquids.
Address (down) [Rebel, B.; Soderberg, M.] Fermilab Natl Accelerator Lab, Batavia, IL 60510 USA, Email: rebel@fnal.gov
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000341927600043 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 1947
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Author Rasco, B.C.; Brewer, N.T.; Yokoyama, R.; Grzywacz, R.; Rykaczewski, K.P.; Tolosa-Delgado, A.; Agramunt, J.; Tain, J.L.; Algora, A.; Hall, O.; Griffin, C.; Davinson, T.; Phong, V.H.; Liu, J.; Nishimura, S.; Kiss, G.G.; Nepal, N.; Estrade, A.
Title The ORNL analysis technique for extracting beta-delayed multi-neutron branching ratios with BRIKEN Type Journal Article
Year 2018 Publication Nuclear Instruments & Methods in Physics Research A Abbreviated Journal Nucl. Instrum. Methods Phys. Res. A
Volume 911 Issue Pages 79-86
Keywords Neutron detectors; Multi-neutron emission data analysis
Abstract Many choices are available in order to evaluate large radioactive decay networks. There are many parameters that influence the calculated beta-decay delayed single and multi-neutron emission branching fractions. We describe assumptions about the decay model, background, and other parameters and their influence on beta-decay delayed multi-neutron emission analysis. An analysis technique, the ORNL BRIKEN analysis procedure, for determining beta-delayed multi-neutron branching ratios in beta-neutron precursors produced by means of heavy-ion fragmentation is presented. The technique is based on estimating the initial activities of zero, one, and two neutrons occurring in coincidence with an ion-implant and beta trigger. The technique allows one to extract beta-delayed multi-neutron decay branching ratios measured with the He-3 BRIKEN neutron counter. As an example, two analyses of the beta-neutron emitter Cu-77 based on different a priori assumptions are presented along with comparisons to literature values.
Address (down) [Rasco, B. C.; Brewer, N. T.; Rykaczewski, K. P.] Oak Ridge Natl Lab, Phys Div, Oak Ridge, TN 37831 USA, Email: brasco@utk.edu
Corporate Author Thesis
Publisher Elsevier Science Bv Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0168-9002 ISBN Medium
Area Expedition Conference
Notes WOS:000450880200013 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3813
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Author Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Lacasta, C.; Miñano, M.; Renzmann, M.; Rossi, E.; Sawyer, C.; Sperlich, D.; Stegler, M.; Ullan, M.; Unno, Y.
Title Mapping the depleted area of silicon diodes using a micro-focused X-ray beam Type Journal Article
Year 2019 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 14 Issue Pages P03024 - 14pp
Keywords Si microstrip and pad detectors; Detector design and construction technologies and materials; Particle tracking detectors (Solid-state detectors); Radiation-hard detectors
Abstract For the Phase-II Upgrade of the ATLAS detector at CERN, the current ATLAS Inner Detector will be replaced with the ATLAS Inner Tracker (ITk). The ITk will be an all-silicon detector, consisting of a pixel tracker and a strip tracker. Sensors for the ITk strip tracker are required to have a low leakage current up to bias voltages of 500V to maintain a low noise and power dissipation. In order to minimise sensor leakage currents, particularly in the high-radiation environment inside the ATLAS detector, sensors are foreseen to be operated at low temperatures and to be manufactured from wafers with a high bulk resistivity of several k Omega.cm. Simulations showed the electric field inside sensors with high bulk resistivity to extend towards the sensor edge, which could lead to increased surface currents for narrow dicing edges. In order to map the electric field inside biased silicon sensors with high bulk resistivity, three diodes from ATLAS silicon strip sensor prototype wafers were studied with a monochromatic, micro-focused X-ray beam at the Diamond Light Source (Didcot, U.K.). For all devices under investigation, the electric field inside the diode was mapped and its dependence on the applied bias voltage was studied.
Address (down) [Poley, L.] Lawrence Berkeley Natl Lab, Cyclotron Rd, Berkeley, CA 94720 USA, Email: Anne-Luise.Poley@desy.de
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000463330900012 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3973
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Author Poley, L. et al; Lacasta, C.
Title Investigations into the impact of locally modified sensor architectures on the detection efficiency of silicon micro-strip sensors Type Journal Article
Year 2017 Publication Journal of Instrumentation Abbreviated Journal J. Instrum.
Volume 12 Issue Pages P07006 - 17pp
Keywords Si microstrip and pad detectors; Inspection with x-rays; Hybrid detectors; Instrumentation for particle accelerators and storage rings – high energy (linear accelerators, synchrotrons)
Abstract The High Luminosity Upgrade of the LHC will require the replacement of the Inner Detector of ATLAS with the Inner Tracker (ITk) in order to cope with higher radiation levels and higher track densities. Prototype silicon strip detector modules are currently developed and their performance is studied in both particle test beams and X-ray beams. In previous test beam measurements of prototype modules, the response of silicon sensors has been studied in detailed scans across individual sensor strips. These scans found instances of sensor strips collecting charge across areas on the sensor deviating from the geometrical width of a sensor strip. The variations have been linked to local features of the sensor architecture. This paper presents results of detailed sensor measurements in both X-ray and particle beams investigating the impact of sensor features (metal pads and p-stops) on the sensor strip response.
Address (down) [Poley, L.] DESY, Notkestr, Hamburg, Germany, Email: Anne-Luise.Poley@desy.de
Corporate Author Thesis
Publisher Iop Publishing Ltd Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1748-0221 ISBN Medium
Area Expedition Conference
Notes WOS:000406392600006 Approved no
Is ISI yes International Collaboration yes
Call Number IFIC @ pastor @ Serial 3234
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