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Olleros, P., Caballero, L., Domingo-Pardo, C., Babiano, V., Ladarescu, I., Calvo, D., et al. (2018). On the performance of large monolithic LaCl3(Ce) crystals coupled to pixelated silicon photosensors. J. Instrum., 13, P03014–17pp.
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Ortiz Arciniega, J. L., Carrio, F., & Valero, A. (2019). FPGA implementation of a deep learning algorithm for real-time signal reconstruction in particle detectors under high pile-up conditions. J. Instrum., 14, P09002–13pp.
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NEXT Collaboration(Monrabal, F. et al), Laing, A., Alvarez, V., Benlloch-Rodriguez, J. M., Carcel, S., Carrion, J. V., et al. (2018). The NEXT White (NEW) detector. J. Instrum., 13, P12010–38pp.
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Poley, L. et al, Bernabeu, J., Civera, J. V., Lacasta, C., Leon, P., Platero, A., et al. (2020). The ABC130 barrel module prototyping programme for the ATLAS strip tracker. J. Instrum., 15(9), P09004–78pp.
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Poley, L. et al, Lacasta, C., & Soldevila, U. (2016). Characterisation of strip silicon detectors for the ATLAS Phase-II Upgrade with a micro-focused X-ray beam. J. Instrum., 11, P07023–12pp.
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Poley, L., Stolzenberg, U., Schwenker, B., Frey, A., Gottlicher, P., Marinas, C., et al. (2021). Mapping the material distribution of a complex structure in an electron beam. J. Instrum., 16(1), P01010–33pp.
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Poley, L. et al, & Lacasta, C. (2017). Investigations into the impact of locally modified sensor architectures on the detection efficiency of silicon micro-strip sensors. J. Instrum., 12, P07006–17pp.
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Poley, L., Blue, A., Bloch, I., Buttar, C., Fadeyev, V., Fernandez-Tejero, J., et al. (2019). Mapping the depleted area of silicon diodes using a micro-focused X-ray beam. J. Instrum., 14, P03024–14pp.
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Rebel, B., Hall, C., Bernard, E., Faham, C. H., Ito, T. M., Lundberg, B., et al. (2014). High voltage in noble liquids for high energy physics. J. Instrum., 9, T08004–57pp.
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Renner, J., Cervera-Villanueva, A., Hernando, J. A., Izmaylov, A., Monrabal, F., Muñoz, J., et al. (2015). Improved background rejection in neutrinoless double beta decay experiments using a magnetic field in a high pressure xenon TPC. J. Instrum., 10, P12020–19pp.
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