TY  - JOUR
AU  - Domingo-Pardo, C.
AU  - Goel, N.
AU  - Engert, T.
AU  - Gerl, J.
AU  - Kojouharov, I.
AU  - Schaffner, H.
AU  - Didierjean, F.
AU  - Duchene, G.
AU  - Sigward, M. H.
PY  - 2011
DA  - 2011//
TI  - A novel gamma-ray imaging method for the pulse-shape characterization of position sensitive semiconductor radiation detectors
T2  - Nucl. Instrum. Methods Phys. Res. A
JO  - Nuclear Instruments & Methods in Physics Research A
SP  - 79
EP  - 88
VL  - 643
IS  - 1
PB  - Elsevier Science Bv
KW  - gamma-detector
KW  - Pulse shape analysis
KW  - Tracking
KW  - Semiconductor
AB  - A new technique for the pulse-shape characterization of gamma-ray position sensitive germanium detectors is presented. This method combines the pulse shape comparison scan (PSCS) principle with a gamma-ray imaging technique. The latter is provided by a supplementary, high performance, position sensitive gamma-ray scintillator detector. We describe the basic aspects of the method and we show measurements made for the study of pulse-shapes in a non-segmented planar HPGe detector. A preliminary application of the PSCS is carried out, although a more detailed investigation is being performed with highly segmented position sensitive detectors.
SN  - 0168-9002
UR  - https://doi.org/10.1016/j.nima.2011.04.021
DO  - 10.1016/j.nima.2011.04.021
LA  - English
N1  - WOS:000292442700014
ID  - Domingo-Pardo_etal2011
ER  -