@Article{Domingo-Pardo_etal2011,
author="Domingo-Pardo, C.
and Goel, N.
and Engert, T.
and Gerl, J.
and Kojouharov, I.
and Schaffner, H.
and Didierjean, F.
and Duchene, G.
and Sigward, M. H.",
title="A novel gamma-ray imaging method for the pulse-shape characterization of position sensitive semiconductor radiation detectors",
journal="Nuclear Instruments {\&} Methods in Physics Research A",
year="2011",
publisher="Elsevier Science Bv",
volume="643",
number="1",
pages="79--88",
optkeywords="gamma-detector; Pulse shape analysis; Tracking; Semiconductor",
abstract="A new technique for the pulse-shape characterization of gamma-ray position sensitive germanium detectors is presented. This method combines the pulse shape comparison scan (PSCS) principle with a gamma-ray imaging technique. The latter is provided by a supplementary, high performance, position sensitive gamma-ray scintillator detector. We describe the basic aspects of the method and we show measurements made for the study of pulse-shapes in a non-segmented planar HPGe detector. A preliminary application of the PSCS is carried out, although a more detailed investigation is being performed with highly segmented position sensitive detectors.",
optnote="WOS:000292442700014",
optnote="exported from refbase (https://references.ific.uv.es/refbase/show.php?record=694), last updated on Thu, 11 Aug 2011 13:27:25 +0000",
issn="0168-9002",
doi="10.1016/j.nima.2011.04.021",
opturl="https://doi.org/10.1016/j.nima.2011.04.021",
language="English"
}