@Article{Andricek_etal2011,
author="Andricek, L. et al
and Lacasta, C.
and Marinas, C.
and Vos, M.",
title="Intrinsic resolutions of DEPFET detector prototypes measured at beam tests",
journal="Nuclear Instruments {\&} Methods in Physics Research A",
year="2011",
publisher="Elsevier Science Bv",
volume="638",
number="1",
pages="24--32",
optkeywords="Silicon pixel detector; Detector resolution; Spatial resolution; DEPFET; Beam test",
abstract="The paper is based on the data of the 2009 DEPFET beam test at CERN SPS. The beam test used beams of pions and electrons with energies between 40 and 120 GeV, and the sensors tested were prototypes with thickness of 450 $\mu$m and pixel pitch between 20 and 32 $\mu$m. Intrinsic resolutions of the detectors are calculated by disentangling the contributions of measurement errors and multiple scattering in tracking residuals. Properties of the intrinsic resolution estimates and factors that influence them are discussed. For the DEPFET detectors in the beam test, the calculation yields intrinsic resolutions of approximate to 1 $\mu$m, with a typical accuracy of 0.1 $\mu$m. Bias scan, angle scan, and energy scan are used as example studies to show that the intrinsic resolutions are a useful tool in studies of detector properties. With sufficiently precise telescopes, detailed resolution maps can be constructed and used to study and optimize detector performance.",
optnote="ISI:000290082600005",
optnote="exported from refbase (https://references.ific.uv.es/refbase/show.php?record=618), last updated on Wed, 08 Sep 2021 14:47:03 +0000",
issn="0168-9002",
doi="10.1016/j.nima.2011.02.015",
opturl="https://doi.org/10.1016/j.nima.2011.02.015",
language="English"
}