TY  - JOUR
AU  - NEXT Collaboration (Ghosh, S. et al
AU  - Martin-Albo, J.
AU  - Carcel, S.
AU  - Carrion, J. V.
AU  - Diaz, J.
AU  - Felkai, R.
AU  - Lopez-March, N.
AU  - Martinez-Vara, M.
AU  - Martinez-Lema, G.
AU  - Muñoz Vidal, J.
AU  - Novella, P.
AU  - Palmeiro, B.
AU  - Querol, M.
AU  - Romo-Luque, C.
AU  - Sorel, M.
AU  - Uson, A.
AU  - Yahlali, N.
PY  - 2020
DA  - 2020//
TI  - Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air
T2  - J. Instrum.
JO  - Journal of Instrumentation
SP  - P11031 - 16pp
VL  - 15
IS  - 11
PB  - Iop Publishing Ltd
KW  - Detector design and construction technologies and materials
KW  - Double-beta decay detectors
KW  - Time projection Chambers (TPC)
AB  - Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm We also see that the reflectance of PIFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
SN  - 1748-0221
UR  - https://arxiv.org/abs/2007.06626
UR  - https://doi.org/10.1088/1748-0221/15/11/P11031
DO  - 10.1088/1748-0221/15/11/P11031
LA  - English
N1  - WOS:000595650800024
ID  - NEXTCollaborationGhosh_etal2020
ER  -