TY  - JOUR
AU  - Schreeck, H.
AU  - Paschen, B.
AU  - Wieduwilt, P.
AU  - Ahlburg, P.
AU  - Andricek, L.
AU  - Dingfelder, J.
AU  - Frey, A.
AU  - Lutticke, F.
AU  - Marinas, C.
AU  - Richter, R.
AU  - Schwenker, B.
PY  - 2020
DA  - 2020//
TI  - Effects of gamma irradiation on DEPFET pixel sensors for the Belle II experiment
T2  - Nucl. Instrum. Methods Phys. Res. A
JO  - Nuclear Instruments & Methods in Physics Research A
SP  - 163522
EP  - 9pp
VL  - 959
PB  - Elsevier
KW  - DEPFET
KW  - Radiation damage
KW  - Particle tracking detectors
KW  - Belle II
AB  - For the Belle II experiment at KEK (Tsukuba, Japan) the KEKB accelerator was upgraded to deliver a 40 times larger instantaneous luminosity than before, which requires an increased radiation hardness of the detector components. As the innermost part of the Belle II detector, the pixel detector (PXD), based on DEPFET (DEpleted P-channel Field Effect Transistor) technology, is most exposed to radiation from the accelerator. An irradiation campaign was performed to verify that the PXD can cope with the expected amount of radiation. We present the results of this measurement campaign in which an X-ray machine was used to irradiate a single PXD half-ladder to a total dose of 266 kGy. The half-ladder is from the same batch as the half-ladders used for Belle II. According to simulations, the total accumulated dose corresponds to 7-10 years of Belle II operation. While individual components have been irradiated before, this campaign is the first full system irradiation. We discuss the effects on the DEPFET sensors, as well as the performance of the front-end electronics. In addition, we present efficiency studies of the half-ladder from beam tests performed before and after the irradiation.
SN  - 0168-9002
UR  - https://doi.org/10.1016/j.nima.2020.163522
DO  - 10.1016/j.nima.2020.163522
LA  - English
N1  - WOS:000518368800016
ID  - Schreeck_etal2020
ER  -