@Article{NEXTCollaborationMcDonald_etal2019,
author="NEXT Collaboration (McDonald, A. D. et al
and Alvarez, V.
and Benlloch-Rodriguez, J. M.
and Carcel, S.
and Carrion, J. V.
and Diaz, J.
and Felkai, R.
and Herrero, P.
and Kekic, M.
and Lopez-March, N.
and Martinez-Lema, G.
and Mu{\~{n}}oz Vidal, J.
and Novella, P.
and Palmeiro, B.
and Perez, J.
and Querol, M.
and Renner, J.
and Romo-Luque, C.
and Sorel, M.
and Uson, A.
and Yahlali, N.",
title="Electron drift and longitudinal diffusion in high pressure xenon-helium gas mixtures",
journal="Journal of Instrumentation",
year="2019",
publisher="Iop Publishing Ltd",
volume="14",
pages="P08009 - 19pp",
optkeywords="Charge transport and multiplication in gas; Gaseous imaging and tracking detectors",
abstract="We report new measurements of the drift velocity and longitudinal diffusion coefficients of electrons in pure xenon gas and in xenon-helium gas mixtures at 1-9 bar and electric field strengths of 50-300 V/cm. In pure xenon we find excellent agreement with world data at all E/P, for both drift velocity and diffusion coefficients. However, a larger value of the longitudinal diffusion coefficient than theoretical predictions is found at low E/P in pure xenon, below the range of reduced fields usually probed by TPC experiments. A similar effect is observed in xenon-helium gas mixtures at somewhat larger E/P. Drift velocities in xenon-helium mixtures are found to be theoretically well predicted. Although longitudinal diffusion in xenon-helium mixtures is found to be larger than anticipated, extrapolation based on the measured longitudinal diffusion coefficients suggest that the use of helium additives to reduce transverse diffusion in xenon gas remains a promising prospect.",
optnote="WOS:000482373600006",
optnote="exported from refbase (https://references.ific.uv.es/refbase/show.php?record=4118), last updated on Wed, 18 May 2022 07:40:55 +0000",
issn="1748-0221",
doi="10.1088/1748-0221/14/08/P08009",
opturl="https://arxiv.org/abs/1902.05544",
opturl="https://doi.org/10.1088/1748-0221/14/08/P08009",
language="English"
}