TY  - JOUR
AU  - n_TOF Collaboration (Praena, J. et al
AU  - Domingo-Pardo, C.
AU  - Giubrone, G.
AU  - Tain, J. L.
AU  - Tarifeño-Saldivia, A.
PY  - 2018
DA  - 2018//
TI  - Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n_TOF facility at CERN
T2  - Nucl. Instrum. Methods Phys. Res. A
JO  - Nuclear Instruments & Methods in Physics Research A
SP  - 142
EP  - 147
VL  - 890
PB  - Elsevier Science Bv
KW  - Neutron induced alpha emission
KW  - Thermal evaporation
KW  - Rutherford backscattering
AB  - Thin S-33 samples for the study of the S-33(n,alpha)Si-30 cross-section at the n_TOF facility at CERN were made by thermal evaporation of S-33 powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of S-33 has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.
SN  - 0168-9002
UR  - https://doi.org/10.1016/j.nima.2018.02.055
DO  - 10.1016/j.nima.2018.02.055
LA  - English
N1  - WOS:000427814900020
ID  - n_TOFCollaborationPraena_etal2018
ER  -