%0 Journal Article
%T Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n_TOF facility at CERN
%A n_TOF Collaboration (Praena, J. et al
%A Domingo-Pardo, C.
%A Giubrone, G.
%A Tain, J. L.
%A Tarifeño-Saldivia, A.
%J Nuclear Instruments & Methods in Physics Research A
%D 2018
%V 890
%I Elsevier Science Bv
%@ 0168-9002
%G English
%F n_TOFCollaborationPraena_etal2018
%O WOS:000427814900020
%O exported from refbase (https://references.ific.uv.es/refbase/show.php?record=3537), last updated on Tue, 13 Oct 2020 12:47:41 +0000
%X Thin S-33 samples for the study of the S-33(n,alpha)Si-30 cross-section at the n_TOF facility at CERN were made by thermal evaporation of S-33 powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of S-33 has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.
%K Neutron induced alpha emission
%K Thermal evaporation
%K Rutherford backscattering
%R 10.1016/j.nima.2018.02.055
%U https://doi.org/10.1016/j.nima.2018.02.055
%P 142-147