TY - JOUR AU - Mata, R. AU - Cros, A. AU - Gimeno, B. AU - Raboso, D. PY - 2024 DA - 2024// TI - Secondary electron emission yield in thick dielectric materials: a comparison between Kelvin probe and capacitive methods T2 - J. Phys. D JO - Journal of Physics D SP - 405302 EP - 9pp VL - 57 IS - 40 PB - IOP Publishing Ltd KW - dielectrics KW - secondary electron emission yield KW - Multipactor in space devices AB - The recent high demand of secondary electron emission yield (SEY) measurements in dielectric materials from space industry has driven SEY laboratories to improve their facilities and measurement techniques. SEY determination by the common capacitive method, also known as pulsed method, is well accepted and has given satisfactory results in most cases. Nevertheless, the samples under study must be prepared according to the experimental limitations of the technique, i.e. they should be manufactured separated from the devices representing faithfully the surface state of the own device and be as thin as possible. A method based on the Kelvin probe (KP) is proposed here to obtain the SEY characteristics of electrically floating Platinum, Kapton and Teflon placed over dielectric spacers with thicknesses ranging from 1.6 to 12.1 mm. The results are compared with those of the capacitive method and indicate that KP SEY curves are less sensitive to spacer thickness. An explanation based on the literature is also given. In all, we have established that KP is better suited for the analysis of dielectric samples thicker than 3 mm. SN - 0022-3727 UR - https://doi.org/10.1088/1361-6463/ad5c6f DO - 10.1088/1361-6463/ad5c6f LA - English N1 - WOS:001269188200001 ID - Mata_etal2024 ER -